000837191 001__ 837191
000837191 005__ 20210129231222.0
000837191 0247_ $$2doi$$a10.1063/1.4992812
000837191 0247_ $$2ISSN$$a0021-8979
000837191 0247_ $$2ISSN$$a0148-6349
000837191 0247_ $$2ISSN$$a1089-7550
000837191 0247_ $$2WOS$$aWOS:000405663800018
000837191 0247_ $$2Handle$$a2128/16838
000837191 0247_ $$2altmetric$$aaltmetric:22218082
000837191 037__ $$aFZJ-2017-06170
000837191 041__ $$aEnglish
000837191 082__ $$a530
000837191 1001_ $$0P:(DE-HGF)0$$aBöttger, U.$$b0$$eCorresponding author
000837191 245__ $$aInteraction between depolarization effects, interface layer, and fatigue behavior in PZT thin film capacitors
000837191 260__ $$aMelville, NY$$bAmerican Inst. of Physics$$c2017
000837191 3367_ $$2DRIVER$$aarticle
000837191 3367_ $$2DataCite$$aOutput Types/Journal article
000837191 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal$$s1516960115_14457
000837191 3367_ $$2BibTeX$$aARTICLE
000837191 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000837191 3367_ $$00$$2EndNote$$aJournal Article
000837191 520__ $$aThe existence of non-ferroelectric regions in ferroelectric thin films evokes depolarization effects leading to a tilt of the P(E) hysteresis loop. The analysis of measured hysteresis of lead zirconate titanate (PZT) thin films is used to determine a depolarization factor which contains quantitative information about interfacial layers as well as ferroelectrically passive zones in the bulk. The derived interfacial capacitance is smaller than that estimated from conventional extrapolation techniques. In addition, the concept of depolarization is used for the investigation of fatigue behavior of PZT thin films indicating that the mechanism of seed inhibition, which is responsible for the effect, occurs in the entire film.
000837191 536__ $$0G:(DE-HGF)POF3-521$$a521 - Controlling Electron Charge-Based Phenomena (POF3-521)$$cPOF3-521$$fPOF III$$x0
000837191 588__ $$aDataset connected to CrossRef
000837191 7001_ $$0P:(DE-Juel1)131022$$aWaser, R.$$b1
000837191 773__ $$0PERI:(DE-600)1476463-5$$a10.1063/1.4992812$$gVol. 122, no. 2, p. 024105 -$$n2$$p024105$$tJournal of applied physics$$v122$$x1089-7550$$y2017
000837191 8564_ $$uhttps://juser.fz-juelich.de/record/837191/files/1.4992812.pdf$$yPublished on 2017-07-13. Available in OpenAccess from 2018-07-13.
000837191 8564_ $$uhttps://juser.fz-juelich.de/record/837191/files/1.4992812.gif?subformat=icon$$xicon$$yPublished on 2017-07-13. Available in OpenAccess from 2018-07-13.
000837191 8564_ $$uhttps://juser.fz-juelich.de/record/837191/files/1.4992812.jpg?subformat=icon-1440$$xicon-1440$$yPublished on 2017-07-13. Available in OpenAccess from 2018-07-13.
000837191 8564_ $$uhttps://juser.fz-juelich.de/record/837191/files/1.4992812.jpg?subformat=icon-180$$xicon-180$$yPublished on 2017-07-13. Available in OpenAccess from 2018-07-13.
000837191 8564_ $$uhttps://juser.fz-juelich.de/record/837191/files/1.4992812.jpg?subformat=icon-640$$xicon-640$$yPublished on 2017-07-13. Available in OpenAccess from 2018-07-13.
000837191 8564_ $$uhttps://juser.fz-juelich.de/record/837191/files/1.4992812.pdf?subformat=pdfa$$xpdfa$$yPublished on 2017-07-13. Available in OpenAccess from 2018-07-13.
000837191 909CO $$ooai:juser.fz-juelich.de:837191$$pdnbdelivery$$pdriver$$pVDB$$popen_access$$popenaire
000837191 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)131022$$aForschungszentrum Jülich$$b1$$kFZJ
000837191 9131_ $$0G:(DE-HGF)POF3-521$$1G:(DE-HGF)POF3-520$$2G:(DE-HGF)POF3-500$$3G:(DE-HGF)POF3$$4G:(DE-HGF)POF$$aDE-HGF$$bKey Technologies$$lFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$vControlling Electron Charge-Based Phenomena$$x0
000837191 9141_ $$y2017
000837191 915__ $$0StatID:(DE-HGF)0200$$2StatID$$aDBCoverage$$bSCOPUS
000837191 915__ $$0StatID:(DE-HGF)0600$$2StatID$$aDBCoverage$$bEbsco Academic Search
000837191 915__ $$0StatID:(DE-HGF)0530$$2StatID$$aEmbargoed OpenAccess
000837191 915__ $$0StatID:(DE-HGF)0100$$2StatID$$aJCR$$bJ APPL PHYS : 2015
000837191 915__ $$0StatID:(DE-HGF)0150$$2StatID$$aDBCoverage$$bWeb of Science Core Collection
000837191 915__ $$0StatID:(DE-HGF)0110$$2StatID$$aWoS$$bScience Citation Index
000837191 915__ $$0StatID:(DE-HGF)0111$$2StatID$$aWoS$$bScience Citation Index Expanded
000837191 915__ $$0StatID:(DE-HGF)9900$$2StatID$$aIF < 5
000837191 915__ $$0StatID:(DE-HGF)0030$$2StatID$$aPeer Review$$bASC
000837191 915__ $$0StatID:(DE-HGF)1150$$2StatID$$aDBCoverage$$bCurrent Contents - Physical, Chemical and Earth Sciences
000837191 915__ $$0StatID:(DE-HGF)0300$$2StatID$$aDBCoverage$$bMedline
000837191 915__ $$0StatID:(DE-HGF)0420$$2StatID$$aNationallizenz
000837191 915__ $$0StatID:(DE-HGF)0199$$2StatID$$aDBCoverage$$bThomson Reuters Master Journal List
000837191 9201_ $$0I:(DE-Juel1)PGI-7-20110106$$kPGI-7$$lElektronische Materialien$$x0
000837191 980__ $$ajournal
000837191 980__ $$aVDB
000837191 980__ $$aUNRESTRICTED
000837191 980__ $$aI:(DE-Juel1)PGI-7-20110106
000837191 9801_ $$aFullTexts