TY  - JOUR
AU  - Böttger, U.
AU  - Waser, R.
TI  - Interaction between depolarization effects, interface layer, and fatigue behavior in PZT thin film capacitors
JO  - Journal of applied physics
VL  - 122
IS  - 2
SN  - 1089-7550
CY  - Melville, NY
PB  - American Inst. of Physics
M1  - FZJ-2017-06170
SP  - 024105
PY  - 2017
AB  - The existence of non-ferroelectric regions in ferroelectric thin films evokes depolarization effects leading to a tilt of the P(E) hysteresis loop. The analysis of measured hysteresis of lead zirconate titanate (PZT) thin films is used to determine a depolarization factor which contains quantitative information about interfacial layers as well as ferroelectrically passive zones in the bulk. The derived interfacial capacitance is smaller than that estimated from conventional extrapolation techniques. In addition, the concept of depolarization is used for the investigation of fatigue behavior of PZT thin films indicating that the mechanism of seed inhibition, which is responsible for the effect, occurs in the entire film.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000405663800018
DO  - DOI:10.1063/1.4992812
UR  - https://juser.fz-juelich.de/record/837191
ER  -