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@ARTICLE{Bttger:837191,
author = {Böttger, U. and Waser, R.},
title = {{I}nteraction between depolarization effects, interface
layer, and fatigue behavior in {PZT} thin film capacitors},
journal = {Journal of applied physics},
volume = {122},
number = {2},
issn = {1089-7550},
address = {Melville, NY},
publisher = {American Inst. of Physics},
reportid = {FZJ-2017-06170},
pages = {024105},
year = {2017},
abstract = {The existence of non-ferroelectric regions in ferroelectric
thin films evokes depolarization effects leading to a tilt
of the P(E) hysteresis loop. The analysis of measured
hysteresis of lead zirconate titanate (PZT) thin films is
used to determine a depolarization factor which contains
quantitative information about interfacial layers as well as
ferroelectrically passive zones in the bulk. The derived
interfacial capacitance is smaller than that estimated from
conventional extrapolation techniques. In addition, the
concept of depolarization is used for the investigation of
fatigue behavior of PZT thin films indicating that the
mechanism of seed inhibition, which is responsible for the
effect, occurs in the entire film.},
cin = {PGI-7},
ddc = {530},
cid = {I:(DE-Juel1)PGI-7-20110106},
pnm = {521 - Controlling Electron Charge-Based Phenomena
(POF3-521)},
pid = {G:(DE-HGF)POF3-521},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000405663800018},
doi = {10.1063/1.4992812},
url = {https://juser.fz-juelich.de/record/837191},
}