Poster (Other)

FZJ-2017-06473

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png In-operando Atomic Force Microscopy experiments on SEI layer Formation on HOPG

Benning, S. (Corresponding author)FZJ*RWTH* ; Hausen, F.FZJ*RWTH*

2017

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Contributing Institute(s):

1. Grundlagen der Elektrochemie (IEK-9)

Research Program(s):

1. 131 - Electrochemical Storage (POF3-131) (POF3-131)
2. HITEC - Helmholtz Interdisciplinary Doctoral Training in Energy and Climate Research (HITEC) (HITEC-20170406) (HITEC-20170406)

Appears in the scientific report 2017

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