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Conference Presentation (Other) FZJ-2017-06520
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On the origin of the fading memory effect in ReRAMs



2017

27th Int. Symp. on Power and Timing, Modeling, Optimization and Simulation, PATMOS2017, ThessalonikiThessaloniki, Greece, 25 Sep 2017 - 27 Sep 20172017-09-252017-09-27

Contributing Institute(s):
  1. Elektronische Materialien (PGI-7)
  2. JARA-FIT (JARA-FIT)
Research Program(s):
  1. 521 - Controlling Electron Charge-Based Phenomena (POF3-521) (POF3-521)

Appears in the scientific report 2017
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The record appears in these collections:
Document types > Presentations > Conference Presentations
JARA > JARA > JARA-JARA\-FIT
Institute Collections > PGI > PGI-7
Workflow collections > Public records
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 Record created 2017-09-13, last modified 2021-01-29
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