000837849 001__ 837849
000837849 005__ 20240610120728.0
000837849 0247_ $$2doi$$a10.1103/PhysRevB.95.245204
000837849 0247_ $$2ISSN$$a0163-1829
000837849 0247_ $$2ISSN$$a0556-2805
000837849 0247_ $$2ISSN$$a1094-1622
000837849 0247_ $$2ISSN$$a1095-3795
000837849 0247_ $$2ISSN$$a1098-0121
000837849 0247_ $$2ISSN$$a1550-235X
000837849 0247_ $$2ISSN$$a2469-9950
000837849 0247_ $$2ISSN$$a2469-9969
000837849 0247_ $$2Handle$$a2128/15309
000837849 0247_ $$2WOS$$aWOS:000402973800004
000837849 037__ $$aFZJ-2017-06626
000837849 082__ $$a530
000837849 1001_ $$0P:(DE-HGF)0$$aRucavado, Esteban$$b0
000837849 245__ $$aEnhancing the optoelectronic properties of amorphous zinc tin oxide by subgap defect passivation: A theoretical and experimental demonstration
000837849 260__ $$aWoodbury, NY$$bInst.$$c2017
000837849 3367_ $$2DRIVER$$aarticle
000837849 3367_ $$2DataCite$$aOutput Types/Journal article
000837849 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal$$s1505823923_21742
000837849 3367_ $$2BibTeX$$aARTICLE
000837849 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000837849 3367_ $$00$$2EndNote$$aJournal Article
000837849 520__ $$aThe link between sub-bandgap states and optoelectronic properties is investigated for amorphous zinc tin oxide (a-ZTO) thin films deposited by RF sputtering. a-ZTO samples were annealed up to 500 °C in oxidizing, neutral, and reducing atmospheres before characterizing their structural and optoelectronic properties by photothermal deflection spectroscopy, near-infrared-visible UV spectrophotometry, Hall effect, Rutherford backscattering, hydrogen forward scattering and transmission electron microscopy. By combining the experimental results with density functional theory calculations, oxygen deficiencies and resulting metal atoms clusters are identified as the source of subgap states, some of which act as electron donors but also as free electron scattering centers. The role of hydrogen on the optoelectronic properties is also discussed. Based on this detailed understanding of the different point defects present in a-ZTO, their impact on optoelectronic properties, and how they can be suppressed by postdeposition annealing treatments, an amorphous indium-free transparent conductive oxide, with a high thermal stability and an electron mobility up to 35cm2V−1s−1, is demonstrated by defect passivation.
000837849 536__ $$0G:(DE-HGF)POF3-143$$a143 - Controlling Configuration-Based Phenomena (POF3-143)$$cPOF3-143$$fPOF III$$x0
000837849 542__ $$2Crossref$$i2017-06-09$$uhttp://link.aps.org/licenses/aps-default-license
000837849 588__ $$aDataset connected to CrossRef
000837849 7001_ $$0P:(DE-HGF)0$$aJeangros, Quentin$$b1
000837849 7001_ $$0P:(DE-HGF)0$$aUrban, Daniel F.$$b2
000837849 7001_ $$0P:(DE-HGF)0$$aHolovský, Jakub$$b3
000837849 7001_ $$0P:(DE-HGF)0$$aRemes, Zdenek$$b4
000837849 7001_ $$0P:(DE-Juel1)145413$$aDuchamp, Martial$$b5
000837849 7001_ $$0P:(DE-HGF)0$$aLanducci, Federica$$b6
000837849 7001_ $$0P:(DE-Juel1)144121$$aDunin-Borkowski, Rafal$$b7$$ufzj
000837849 7001_ $$0P:(DE-Juel1)133008$$aKörner, Wolfgang$$b8$$ufzj
000837849 7001_ $$0P:(DE-HGF)0$$aElsässer, Christian$$b9
000837849 7001_ $$0P:(DE-HGF)0$$aHessler-Wyser, Aïcha$$b10
000837849 7001_ $$0P:(DE-HGF)0$$aMorales-Masis, Monica$$b11
000837849 7001_ $$0P:(DE-HGF)0$$aBallif, Christophe$$b12
000837849 77318 $$2Crossref$$3journal-article$$a10.1103/physrevb.95.245204$$bAmerican Physical Society (APS)$$d2017-06-09$$n24$$p245204$$tPhysical Review B$$v95$$x2469-9950$$y2017
000837849 773__ $$0PERI:(DE-600)2844160-6$$a10.1103/PhysRevB.95.245204$$gVol. 95, no. 24, p. 245204$$n24$$p245204$$tPhysical review / B$$v95$$x2469-9950$$y2017
000837849 8564_ $$uhttps://juser.fz-juelich.de/record/837849/files/PhysRevB.95.245204.pdf$$yOpenAccess
000837849 8564_ $$uhttps://juser.fz-juelich.de/record/837849/files/PhysRevB.95.245204.gif?subformat=icon$$xicon$$yOpenAccess
000837849 8564_ $$uhttps://juser.fz-juelich.de/record/837849/files/PhysRevB.95.245204.jpg?subformat=icon-1440$$xicon-1440$$yOpenAccess
000837849 8564_ $$uhttps://juser.fz-juelich.de/record/837849/files/PhysRevB.95.245204.jpg?subformat=icon-180$$xicon-180$$yOpenAccess
000837849 8564_ $$uhttps://juser.fz-juelich.de/record/837849/files/PhysRevB.95.245204.jpg?subformat=icon-640$$xicon-640$$yOpenAccess
000837849 8564_ $$uhttps://juser.fz-juelich.de/record/837849/files/PhysRevB.95.245204.pdf?subformat=pdfa$$xpdfa$$yOpenAccess
000837849 909CO $$ooai:juser.fz-juelich.de:837849$$pdnbdelivery$$pVDB$$pdriver$$popen_access$$popenaire
000837849 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)144121$$aForschungszentrum Jülich$$b7$$kFZJ
000837849 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)133008$$aForschungszentrum Jülich$$b8$$kFZJ
000837849 9131_ $$0G:(DE-HGF)POF3-143$$1G:(DE-HGF)POF3-140$$2G:(DE-HGF)POF3-100$$3G:(DE-HGF)POF3$$4G:(DE-HGF)POF$$aDE-HGF$$bEnergie$$lFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$vControlling Configuration-Based Phenomena$$x0
000837849 9141_ $$y2017
000837849 915__ $$0StatID:(DE-HGF)0200$$2StatID$$aDBCoverage$$bSCOPUS
000837849 915__ $$0StatID:(DE-HGF)0600$$2StatID$$aDBCoverage$$bEbsco Academic Search
000837849 915__ $$0LIC:(DE-HGF)APS-112012$$2HGFVOC$$aAmerican Physical Society Transfer of Copyright Agreement
000837849 915__ $$0StatID:(DE-HGF)0100$$2StatID$$aJCR$$bPHYS REV B : 2015
000837849 915__ $$0StatID:(DE-HGF)0150$$2StatID$$aDBCoverage$$bWeb of Science Core Collection
000837849 915__ $$0StatID:(DE-HGF)0110$$2StatID$$aWoS$$bScience Citation Index
000837849 915__ $$0StatID:(DE-HGF)0111$$2StatID$$aWoS$$bScience Citation Index Expanded
000837849 915__ $$0StatID:(DE-HGF)9900$$2StatID$$aIF < 5
000837849 915__ $$0StatID:(DE-HGF)0510$$2StatID$$aOpenAccess
000837849 915__ $$0StatID:(DE-HGF)0030$$2StatID$$aPeer Review$$bASC
000837849 915__ $$0StatID:(DE-HGF)1150$$2StatID$$aDBCoverage$$bCurrent Contents - Physical, Chemical and Earth Sciences
000837849 915__ $$0StatID:(DE-HGF)0300$$2StatID$$aDBCoverage$$bMedline
000837849 915__ $$0StatID:(DE-HGF)0199$$2StatID$$aDBCoverage$$bThomson Reuters Master Journal List
000837849 920__ $$lyes
000837849 9201_ $$0I:(DE-Juel1)ER-C-1-20170209$$kER-C-1$$lPhysik Nanoskaliger Systeme$$x0
000837849 9201_ $$0I:(DE-Juel1)PGI-5-20110106$$kPGI-5$$lMikrostrukturforschung$$x1
000837849 9801_ $$aFullTexts
000837849 980__ $$ajournal
000837849 980__ $$aVDB
000837849 980__ $$aUNRESTRICTED
000837849 980__ $$aI:(DE-Juel1)ER-C-1-20170209
000837849 980__ $$aI:(DE-Juel1)PGI-5-20110106
000837849 981__ $$aI:(DE-Juel1)ER-C-1-20170209
000837849 999C5 $$1A. Shah$$2Crossref$$9-- missing cx lookup --$$a10.1201/b16327$$y2010
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1016/0025-5408(68)90023-8
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1016/j.tsf.2009.09.044
000837849 999C5 $$1A. Klein$$2Crossref$$9-- missing cx lookup --$$a10.1111/jace.12143$$p331 -$$tJ. Am. Ceram. Soc.$$v96$$y2013
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1063/1.3696978
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1016/j.tsf.2005.08.175
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1063/1.3567513
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1103/PhysRevB.86.165210
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1103/PhysRevB.90.195142
000837849 999C5 $$1W. Körner$$2Crossref$$oW. Körner 2015$$y2015
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1016/j.tsf.2013.05.146
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1016/0022-3697(58)90069-6
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1116/1.2839860
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1002/pssc.200779300
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1063/1.2927306
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1103/PhysRevB.80.081201
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1103/PhysRevB.80.193202
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1103/PhysRevB.84.035213
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1103/PhysRevB.82.193201
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1063/1.4832076
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1063/1.4936552
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1103/PhysRevLett.101.055502
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1103/PhysRevLett.85.1012
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1063/1.4954693
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1103/PhysRevLett.88.045504
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.7567/JJAPS.2S2.253
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1038/nphoton.2012.282
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1002/aelm.201600529
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1016/j.apsusc.2007.03.036
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1016/j.jallcom.2014.11.150
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1063/1.4861378
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1116/1.581888
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1002/pssa.201431918
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1063/1.4896051
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1002/adfm.201503753
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1063/1.4971361
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1088/0953-8984/23/33/334214
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1063/1.4883257
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1016/j.orgel.2016.05.016
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1063/1.91395
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1016/S0304-3991(02)00155-9
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1039/a606455h
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1103/PhysRevB.50.17953
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1103/PhysRevB.54.11169
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1103/PhysRevB.59.1758
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1088/0953-8984/2/19/006
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1088/0953-8984/4/22/017
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1088/0953-8984/7/48/010
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1103/PhysRevB.69.165116
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1103/PhysRevB.54.5495
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1103/PhysRevB.81.085324
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1063/1.4945316
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1016/0040-6090(83)90256-0
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1109/JPHOTOV.2015.2450993
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1016/j.tsf.2014.01.068
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1149/2.011301jss
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1038/nmat1795
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1016/j.tsf.2005.08.257
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1021/acsami.5b04420
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1063/1.357383
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1080/14786440808561235
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1016/j.jssc.2005.07.019
000837849 999C5 $$1J. I. Pankove$$2Crossref$$oJ. I. Pankove Optical Processes in Semiconductors 2012$$tOptical Processes in Semiconductors$$y2012
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1063/1.4826895
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1002/pssa.201431871
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1021/acs.chemmater.6b01608
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1016/j.tsf.2006.07.020
000837849 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1103/PhysRevB.66.035203