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@ARTICLE{Winkler:837855,
      author       = {Winkler, Florian and Tavabi, Amir Hossein and Barthel, Juri
                      and Duchamp, Martial and Yucelen, Emrah and Borghardt, Sven
                      and Kardynal, Beata and Dunin-Borkowski, Rafal},
      title        = {{Q}uantitative measurement of mean inner potential and
                      specimen thickness from high-{R}esolution off-axis electron
                      holograms of ultrathin layered {WS}e2},
      journal      = {Ultramicroscopy},
      volume       = {178},
      issn         = {0304-3991},
      address      = {Amsterdam},
      publisher    = {Elsevier Science},
      reportid     = {FZJ-2017-06632},
      pages        = {38 - 47},
      year         = {2017},
      abstract     = {The phase and amplitude of the electron wavefunction that
                      has passed through ultra-thin flakes of WSe2 is measured
                      from high-resolution off-axis electron holograms. Both the
                      experimental measurements and corresponding computer
                      simulations are used to show that, as a result of dynamical
                      diffraction, the spatially averaged phase does not increase
                      linearly with specimen thickness close to an [001] zone axis
                      orientation even when the specimen has a thickness of only a
                      few layers. It is then not possible to infer the local
                      specimen thickness of the WSe2 from either the phase or the
                      amplitude alone. Instead, we show that the combined analysis
                      of phase and amplitude from experimental measurements and
                      simulations allows an accurate determination of the local
                      specimen thickness. The relationship between phase and
                      projected potential is shown to be approximately linear for
                      extremely thin specimens that are tilted by several degrees
                      in certain directions from the [001] zone axis. A knowledge
                      of the specimen thickness then allows the electrostatic
                      potential to be determined from the measured phase. By using
                      this combined approach, we determine a value for the mean
                      inner potential of WSe2 of 18.9±0.8 V, which is $12\%$
                      lower than the value calculated from neutral atom scattering
                      factors.},
      cin          = {ER-C-1 / PGI-5},
      ddc          = {570},
      cid          = {I:(DE-Juel1)ER-C-1-20170209 / I:(DE-Juel1)PGI-5-20110106},
      pnm          = {143 - Controlling Configuration-Based Phenomena (POF3-143)},
      pid          = {G:(DE-HGF)POF3-143},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000403862900007},
      doi          = {10.1016/j.ultramic.2016.07.016},
      url          = {https://juser.fz-juelich.de/record/837855},
}