%0 Conference Paper
%A Dunin-Borkowski, Rafal
%A Mayer, Joachim
%A Tillmann, Karsten
%T Introduction to a special issue on Frontieres of Aberration Corrected Electron Microscopy in honour of Robert Sinclair and Nestor J. Zaluzec on the occasion of their 70th and 65th birthdays
%@ 0304-3991
%C Amsterdam
%I Elsevier Science
%M FZJ-2017-06649
%P 0304 - 3991
%D 2016
%B PICO 2017
%C 30 Apr 2017 - 4 May 2017, Kasteel Vaalsbroek (The Netherlands)
Y2 30 Apr 2017 - 4 May 2017
M2 Kasteel Vaalsbroek, The Netherlands
%F PUB:(DE-HGF)8
%9 Contribution to a conference proceedings
%U https://juser.fz-juelich.de/record/837878