Contribution to a conference proceedings FZJ-2017-06649

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Introduction to a special issue on Frontieres of Aberration Corrected Electron Microscopy in honour of Robert Sinclair and Nestor J. Zaluzec on the occasion of their 70th and 65th birthdays

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2016
Elsevier Science Amsterdam

PICO 2017, Kasteel VaalsbroekKasteel Vaalsbroek, The Netherlands, 30 Apr 2017 - 4 May 20172017-04-302017-05-04 Amsterdam : Elsevier Science ()

Classification:

Contributing Institute(s):
  1. Physik Nanoskaliger Systeme (ER-C-1)
  2. Technische und administrative Infrastruktur (ER-C-KI)
  3. Mikrostrukturforschung (PGI-5)
Research Program(s):
  1. 143 - Controlling Configuration-Based Phenomena (POF3-143) (POF3-143)

Appears in the scientific report 2017
Database coverage:
Medline ; BIOSIS Previews ; Current Contents - Life Sciences ; Current Contents - Physical, Chemical and Earth Sciences ; Ebsco Academic Search ; IF < 5 ; JCR ; NCBI Molecular Biology Database ; NationallizenzNationallizenz ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection
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The record appears in these collections:
Dokumenttypen > Ereignisse > Beiträge zu Proceedings
Institutssammlungen > ER-C > ER-C-KI
Institutssammlungen > ER-C > ER-C-1
Institutssammlungen > PGI > PGI-5
Workflowsammlungen > Öffentliche Einträge
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 Datensatz erzeugt am 2017-09-20, letzte Änderung am 2024-06-10



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