Hauptseite > Publikationsdatenbank > Introduction to a special issue on Frontieres of Aberration Corrected Electron Microscopy in honour of Robert Sinclair and Nestor J. Zaluzec on the occasion of their 70th and 65th birthdays |
Contribution to a conference proceedings | FZJ-2017-06649 |
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2016
Elsevier Science
Amsterdam
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