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Modelling of Resistive Switching Devices based on the Valence Change Mechanism
Menzel, S.FZJ* ; Funck, C.FZJ* ; La Torre, C. ; Marchewka, A. ; Fleck, K. ; Bäumer, C.FZJ* ; Rana, V.FZJ* ; Hoffmann-Eifert, S.FZJ* ; Dittmann, R.FZJ* ; Waser, R.
2017
2017Non-volatile Memory Technology Symposium, NVMTS, AachenAachen, Germany, 30 Aug 2017 - 1 Sep 20172017-08-302017-09-01
Contributing Institute(s):
- Elektronische Materialien (PGI-7)
- JARA-FIT (JARA-FIT)
Research Program(s):
- 521 - Controlling Electron Charge-Based Phenomena (POF3-521) (POF3-521)
Appears in the scientific report
2017