% IMPORTANT: The following is UTF-8 encoded. This means that in the presence
% of non-ASCII characters, it will not work with BibTeX 0.99 or older.
% Instead, you should use an up-to-date BibTeX implementation like “bibtex8” or
% “biber”.
@MASTERSTHESIS{ArumugamGurunathan:837893,
author = {Arumugam Gurunathan, Dinesh Kumar},
othercontributors = {Lepsa, Mihail Ion},
title = {{III}-{V} core-shell nanowires for low power electronic
devices},
school = {Technische Universität Dresden},
type = {MS},
address = {Jülich},
publisher = {Forschungszentrum},
reportid = {FZJ-2017-06664},
pages = {77 p.},
year = {2017},
note = {Technische Universität Dresden, Masterarbeit, 2017},
abstract = {The InAs/GaSb core-shell nanowires (NWs) are of particular
interest due to the broken gap or type III band alignment
which makes them an ideal candidate for tunnelling devices.
This work investigates the growth, morphological, structural
and electrical characterization of InAs/GaSb NWs grown
selectively by molecular beam epitaxy (MBE) on pre-patterned
SiO2/Si.A first part of the thesis is devoted to substrate
preparation for selective area growth of InAs NWs. The
substrate preparation is a critical process in selective
area MBE growth. In this thesis work, substrate preparation
for selective growth of InAs nanowires is optimized. Then,
our growth investigations result in the finding of suitable
growth parameters of InAs and InAs/GaSb NWs grown on
pre-patterned substrates. The influence of pitch (inter-wire
distance) and hole diameter on the InAs NW growth is also
discussed. In the case of InAs/GaSb core-shell nanowire
growth, the effect of the shell growth temperature and
doping of GaSb shell are examined. The morphology of InAs
and InAs/GaS NWs, as well as the crystal structure of the
InAs/GaSb NWs, are investigated using SEM, STEM/EDX and
HR-TEM measurements. The STEM/EDX and HR-TEM measurements
are accomplished by cooperation with other groups. The
results show negligible dislocations at the core-shell
interface indicating the almost lattice matched InAs/GaSb NW
heterostructure. Also, defects like stacking faults and
twinning are observed at the top of the GaSb shell.The
second part of the work is focused on the InAs/GaSb nanowire
device fabrication and its electrical characterization. The
problems faced during selective etching of GaSb shell for
contacting InAs core give an insight about the difficulty in
establishing contacts for core and shell separately in
InAs/GaSb radial NWs. Contacting GaSb shell is a challenging
process because the GaSb shell is easily oxidizing and
dissolves by reacting with metal contacts. So, careful
attempts are made to contact GaSb shell with Nb/Au using
those NWs for electrical characterization. The room
temperature electrical characterization presents the impact
of the shell doping on current-voltage characteristics in
combination with the back gate voltage. The preliminary
results of the electrical measurements are analyzed. The
doped GaSb shell in InAs/GaSb NWs exhibited a linear (ohmic)
characteristics independent of gate voltage control, while
non-doped shell showed the dependency on the back gate
voltage.},
cin = {PGI-9 / PGI-10},
cid = {I:(DE-Juel1)PGI-9-20110106 / I:(DE-Juel1)PGI-10-20170113},
pnm = {521 - Controlling Electron Charge-Based Phenomena
(POF3-521)},
pid = {G:(DE-HGF)POF3-521},
typ = {PUB:(DE-HGF)19},
url = {https://juser.fz-juelich.de/record/837893},
}