TY  - JOUR
AU  - Barthel, Juri
AU  - Lentzen, Markus
AU  - Thust, Andreas
TI  - Response to the comment by C. Kisielowsky, H.A. Calderon, F.R. Chen, S. Helveg, J.R. Jinschek, P. Specht, D. van Dyck on the article "On the influence of the electron dose-rate on the HRTEM Image contrast" by J. Barthel, M. Lentzen, A. Thust
JO  - Ultramicroscopy
VL  - 179
SN  - 0304-3991
CY  - Amsterdam
PB  - Elsevier Science
M1  - FZJ-2017-06683
SP  - 113 - 115
PY  - 2017
AB  - In a recent article [1] we examined the influence of the applied electron dose rate on the magnitude of the image contrast in high-resolution transmission electron microscopy (HRTEM). We concluded that the magnitude of the image contrast is not substantially affected by the applied electron dose rate. This result is in obvious contradiction to numerous earlier publications by Kisielowski and coworkers [2–7], who commented our recent article due to this contradiction. The present short communication is a response to the comment of Kisielowski and coworkers on our recent article, where we provide additional arguments supporting our initial findings and conclusions on the magnitude of the image contrast in HRTEM.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000403985600016
DO  - DOI:10.1016/j.ultramic.2017.04.004
UR  - https://juser.fz-juelich.de/record/837913
ER  -