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@ARTICLE{Liu:837920,
author = {Liu, J. and Li, F. and Zeng, Y. and Jiang, Z. and Liu, L.
and Wang, D. and Ye, Z.-G. and Jia, C.-L.},
title = {{I}nsights into the dielectric response of ferroelectric
relaxors from statistical modeling},
journal = {Physical review / B},
volume = {96},
number = {5},
issn = {2469-9950},
address = {Woodbury, NY},
publisher = {Inst.},
reportid = {FZJ-2017-06690},
pages = {054115},
year = {2017},
abstract = {Ferroelectric relaxors are complex materials with distinct
properties. The understanding of their dielectric
susceptibility, which strongly depends on both temperature
and probing frequency, has been a challenge for researchers
for many years. Here we report a macroscopic and
phenomenological approach based on statistical modeling to
investigate how the dielectric response of a relaxor depends
on temperature. Employing the Maxwell-Boltzmann distribution
and considering temperature-dependent dipolar orientational
polarizability, we propose a minimum statistical model and
specific equations to understand and fit numerical and
experimental dielectric responses versus temperature. We
show that the proposed formula can successfully fit the
dielectric response of typical relaxors, including
Ba(Zr,Ti)O3,0.87Pb(Zn1/3Nb2/3)O3−0.13PbTiO3,0.95Pb(Mg1/3Nb2/3)O3−0.05Pb(Zr0.53Ti0.47)O3,
and Bi-based compounds, which demonstrates the general
applicability of this approach.},
cin = {ER-C-1},
ddc = {530},
cid = {I:(DE-Juel1)ER-C-1-20170209},
pnm = {143 - Controlling Configuration-Based Phenomena (POF3-143)},
pid = {G:(DE-HGF)POF3-143},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000408112200001},
doi = {10.1103/PhysRevB.96.054115},
url = {https://juser.fz-juelich.de/record/837920},
}