000838087 001__ 838087 000838087 005__ 20210129231505.0 000838087 0247_ $$2doi$$a10.1016/j.ultramic.2016.12.024 000838087 0247_ $$2WOS$$aWOS:000403992200028 000838087 037__ $$aFZJ-2017-100010 000838087 041__ $$aEnglish 000838087 082__ $$a570 000838087 1001_ $$0P:(DE-HGF)0$$aWang, Z. C.$$b0 000838087 245__ $$aEffects of dynamic diffraction conditions on magnetic parameter determination in a double perovskite Sr$_{2}$ FeMoO$_{6}$ using electron energy-loss magnetic chiral dichroism 000838087 260__ $$aAmsterdam$$bElsevier Science$$c2017 000838087 3367_ $$2DRIVER$$aarticle 000838087 3367_ $$2DataCite$$aOutput Types/Journal article 000838087 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal$$s1507111212_26428 000838087 3367_ $$2BibTeX$$aARTICLE 000838087 3367_ $$2ORCID$$aJOURNAL_ARTICLE 000838087 3367_ $$00$$2EndNote$$aJournal Article 000838087 520__ $$aElectron energy-loss magnetic chiral dichroism (EMCD) spectroscopy, which is similar to the well-established X-ray magnetic circular dichroism spectroscopy (XMCD), can determine the quantitative magnetic parameters of materials with high spatial resolution. One of the major obstacles in quantitative analysis using the EMCD technique is the relatively poor signal-to-noise ratio (SNR), compared to XMCD. Here, in the example of a double perovskite Sr$_{2}$ FeMoO$_{6}$, we predicted the optimal dynamical diffraction conditions such as sample thickness, crystallographic orientation and detection aperture position by theoretical simulations. By using the optimized conditions, we showed that the SNR of experimental EMCD spectra can be significantly improved and the error of quantitative magnetic parameter determined by EMCD technique can be remarkably lowered. Our results demonstrate that, with enhanced SNR, the EMCD technique can be a unique tool to understand the structure-property relationship of magnetic materials particularly in the high-density magnetic recording and spintronic devices by quantitatively determining magnetic structure and properties at the nanometer scale. 000838087 536__ $$0G:(DE-HGF)POF3-143$$a143 - Controlling Configuration-Based Phenomena (POF3-143)$$cPOF3-143$$fPOF III$$x0 000838087 588__ $$aDataset connected to CrossRef 000838087 7001_ $$0P:(DE-HGF)0$$aZhong, X. Y.$$b1$$eCorresponding author 000838087 7001_ $$0P:(DE-Juel1)145711$$aJin, L.$$b2$$ufzj 000838087 7001_ $$0P:(DE-HGF)0$$aChen, X. 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