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@ARTICLE{Yang:838088,
      author       = {Yang, Hao and MacLaren, Lan and Jones, Lewys and Martinez,
                      Gerardo T. and Simson, Martin and Huth, Martin and Ryll,
                      Henning and Soltau, Heike and Sagawa, Ryusuke and Kondo,
                      Yukihito and Ophus, Colin and Ercius, Peter and Jin, Lei and
                      Kovacs, Andras and Nellist, Peter D.},
      title        = {{E}lectron ptychographic {P}hase {I}maging of light
                      elements in crystalline materials using {W}igner
                      {D}istribution deconvolution},
      journal      = {Ultramicroscopy},
      volume       = {180},
      issn         = {0304-3991},
      address      = {Amsterdam},
      publisher    = {Elsevier Science},
      reportid     = {FZJ-2017-100011},
      pages        = {173 - 179},
      year         = {2017},
      abstract     = {Recent development in fast pixelated detector technology
                      has allowed a two dimensional diffraction pattern to be
                      recorded at every probe position of a two dimensional raster
                      scan in a scanning transmission electron microscope (STEM),
                      forming an information-rich four dimensional (4D) dataset.
                      Electron ptychography has been shown to enable efficient
                      coherent phase imaging of weakly scattering objects from a
                      4D dataset recorded using a focused electron probe, which is
                      optimised for simultaneous incoherent Z-contrast imaging and
                      spectroscopy in STEM. Therefore coherent phase contrast and
                      incoherent Z-contrast imaging modes can be efficiently
                      combined to provide a good sensitivity of both light and
                      heavy elements at atomic resolution. In this work, we
                      explore the application of electron ptychography for atomic
                      resolution imaging of strongly scattering crystalline
                      specimens, and present experiments on imaging crystalline
                      specimens including samples containing defects, under
                      dynamical channelling conditions using an aberration
                      corrected microscope. A ptychographic reconstruction method
                      called Wigner distribution deconvolution (WDD) was
                      implemented. Experimental results and simulation results
                      suggest that ptychography provides a readily interpretable
                      phase image and great sensitivity for imaging light elements
                      at atomic resolution in relatively thin crystalline
                      materials.},
      cin          = {ER-C-1},
      ddc          = {570},
      cid          = {I:(DE-Juel1)ER-C-1-20170209},
      pnm          = {143 - Controlling Configuration-Based Phenomena (POF3-143)},
      pid          = {G:(DE-HGF)POF3-143},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000404203500021},
      pubmed       = {pmid:28434783},
      doi          = {10.1016/j.ultramic.2017.02.006},
      url          = {https://juser.fz-juelich.de/record/838088},
}