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@PHDTHESIS{Luong:838669,
author = {Luong, Gia Vinh},
title = {{G}ate-{A}ll-{A}round {S}ilicon {N}anowire {T}unnel {FET}s
for {L}ow {P}ower {A}pplications},
volume = {154},
school = {RWTH Aachen},
type = {Dr.},
address = {Jülich},
publisher = {Forschungszentrum Jülich GmbH Zentralbibliothek, Verlag},
reportid = {FZJ-2017-07235},
isbn = {978-3-95806-259-7},
series = {Schriften des Forschungszentrums Jülich. Reihe
Schlüsseltechnologien / Key Technologies},
pages = {II, 136 S.},
year = {2017},
note = {RWTH Aachen, Diss., 2017},
abstract = {In the era of portable electronic devices energy efficient
integrated circuits (ICs) are highly demanded where the
power consumption needs to be minimized by the reduction of
the supply voltage V$_{dd}$. Digitl ciruits based on the
contemplementary metal-oxide-semiconductor field effect
transistors (MOSFETs), however, owns a physical limit of the
minimum inverse sub-threshold slope (SS) of 60 mV/dec at
room temperature. As consequence, the reduction of V$_{dd}$
either leads to low ON-current or inceases the OFF-current
exponentally which in turn results in high power device
concept with the potential to replace MOSFETs in low power
applications. In comparson, TFETs can offer steeper
transition between of OFF and the ON-state (SS<60mV/dec)
since the current transport mechamism relies on band-to-band
tunneling. Within the framework of this thesis strained Si
gate-all-around (GAA) nanowire TFETs are
ddddddddddfabricated in order to achieve high tunneling
currents and small SS. Very small namowires, down to 5 mm in
thickness and down to 15 nm in width, are surrounded by
HfO$_{2}$/TiN as high-$\textit{k}$ dielectric and metal gate
to obtain optimal gate electrostatics for the device. Tilted
ion i mplantation into the performed thin epitaxial
NiSi$_{2}$ has been performed to benefit from dopant
segregation that results in sharper doping profile for
source and drain. Strained Si GAA nanowire p- and n-TFETs
have been characterized indicating comparable current
performance with 5 $\mu$A/$\mu$m at V$_{dd}$=0.5 V. SS below
69 mV/dec has been measured for the n-TFET for I$_{d}$ <
10$^{-4} \mu$m at V$_{ds}$ = 0.1 V at room temperature.
However, most of the switching characteristics of the TFETs
yield SS larger than the thermal limit. Trap-assisted
tunneling is found to be the main root cause. [...]},
cin = {PGI-9},
cid = {I:(DE-Juel1)PGI-9-20110106},
pnm = {899 - ohne Topic (POF3-899)},
pid = {G:(DE-HGF)POF3-899},
typ = {PUB:(DE-HGF)3 / PUB:(DE-HGF)11},
urn = {urn:nbn:de:0001-2017121328},
url = {https://juser.fz-juelich.de/record/838669},
}