000840158 001__ 840158
000840158 005__ 20210129231747.0
000840158 0247_ $$2doi$$a10.1186/1556-276X-8-475
000840158 0247_ $$2ISSN$$a1556-276X
000840158 0247_ $$2ISSN$$a1931-7573
000840158 0247_ $$2Handle$$a2128/15958
000840158 0247_ $$2pmid$$apmid:24225330
000840158 037__ $$aFZJ-2017-07713
000840158 082__ $$a600
000840158 1001_ $$0P:(DE-HGF)0$$aStroppa, Daniel G$$b0$$eCorresponding author
000840158 245__ $$aAssessment of a nanocrystal 3-D morphology by the analysis of single HAADF-HRSTEM images
000840158 260__ $$aNew York, NY [u.a.]$$bSpringer$$c2013
000840158 3367_ $$2DRIVER$$aarticle
000840158 3367_ $$2DataCite$$aOutput Types/Journal article
000840158 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal$$s1511517034_11653
000840158 3367_ $$2BibTeX$$aARTICLE
000840158 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000840158 3367_ $$00$$2EndNote$$aJournal Article
000840158 520__ $$aThis work presents the morphological characterization of CeO2 nanocrystals by the analysis of single unfiltered high-angle annular dark-field (HAADF)-high-resolution scanning transmission electron microscopy (HRSTEM) images. The thickness of each individual atomic column is estimated by the classification of its HAADF integrated intensity using a Gaussian mixture model. The resulting thickness maps obtained from two example nanocrystals with distinct morphology were analyzed with aid of the symmetry from the CeO2 crystallographic structure, providing an approximation for their 3-D morphology with high spatial resolution. A confidence level of ±1 atom per atomic column along the viewing direction on the thickness estimation is indicated by the use of multislice image simulation. The described characterization procedure stands out as a simple approach for retrieving morphological parameters of individual nanocrystals, such as volume and specific surface areas for different crystalline planes. The procedure is an alternative to the tilt-series tomography technique for a number of nanocrystalline systems, since its application does not require the acquisition of multiple images from the same nanocrystal along different zone axes
000840158 536__ $$0G:(DE-HGF)POF3-143$$a143 - Controlling Configuration-Based Phenomena (POF3-143)$$cPOF3-143$$fPOF III$$x0
000840158 588__ $$aDataset connected to CrossRef
000840158 7001_ $$0P:(DE-HGF)0$$aRighetto, Ricardo D$$b1
000840158 7001_ $$0P:(DE-HGF)0$$aMontoro, Luciano A$$b2
000840158 7001_ $$0P:(DE-Juel1)130723$$aHouben, Lothar$$b3
000840158 7001_ $$0P:(DE-Juel1)130525$$aBarthel, Juri$$b4
000840158 7001_ $$0P:(DE-HGF)0$$aCordeiro, Marco AL$$b5
000840158 7001_ $$0P:(DE-HGF)0$$aLeite, Edson R$$b6
000840158 7001_ $$0P:(DE-HGF)0$$aWeng, Weihao$$b7
000840158 7001_ $$0P:(DE-HGF)0$$aKiely, Christopher J$$b8
000840158 7001_ $$0P:(DE-HGF)0$$aRamirez, Antonio J$$b9
000840158 773__ $$0PERI:(DE-600)2253244-4$$a10.1186/1556-276X-8-475$$gVol. 8, no. 1, p. 475 -$$n1$$p475 -$$tNanoscale research letters$$v8$$x1556-276X$$y2013
000840158 8564_ $$uhttps://juser.fz-juelich.de/record/840158/files/1556-276X-8-475.pdf$$yOpenAccess
000840158 8564_ $$uhttps://juser.fz-juelich.de/record/840158/files/1556-276X-8-475.gif?subformat=icon$$xicon$$yOpenAccess
000840158 8564_ $$uhttps://juser.fz-juelich.de/record/840158/files/1556-276X-8-475.jpg?subformat=icon-1440$$xicon-1440$$yOpenAccess
000840158 8564_ $$uhttps://juser.fz-juelich.de/record/840158/files/1556-276X-8-475.jpg?subformat=icon-180$$xicon-180$$yOpenAccess
000840158 8564_ $$uhttps://juser.fz-juelich.de/record/840158/files/1556-276X-8-475.jpg?subformat=icon-640$$xicon-640$$yOpenAccess
000840158 8564_ $$uhttps://juser.fz-juelich.de/record/840158/files/1556-276X-8-475.pdf?subformat=pdfa$$xpdfa$$yOpenAccess
000840158 909CO $$ooai:juser.fz-juelich.de:840158$$pdnbdelivery$$pVDB$$pdriver$$popen_access$$popenaire
000840158 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)130525$$aForschungszentrum Jülich$$b4$$kFZJ
000840158 9131_ $$0G:(DE-HGF)POF3-143$$1G:(DE-HGF)POF3-140$$2G:(DE-HGF)POF3-100$$3G:(DE-HGF)POF3$$4G:(DE-HGF)POF$$aDE-HGF$$bEnergie$$lFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$vControlling Configuration-Based Phenomena$$x0
000840158 915__ $$0LIC:(DE-HGF)CCBY2$$2HGFVOC$$aCreative Commons Attribution CC BY 2.0
000840158 915__ $$0StatID:(DE-HGF)0200$$2StatID$$aDBCoverage$$bSCOPUS
000840158 915__ $$0StatID:(DE-HGF)0100$$2StatID$$aJCR$$bNANOSCALE RES LETT : 2015
000840158 915__ $$0StatID:(DE-HGF)0501$$2StatID$$aDBCoverage$$bDOAJ Seal
000840158 915__ $$0StatID:(DE-HGF)0500$$2StatID$$aDBCoverage$$bDOAJ
000840158 915__ $$0StatID:(DE-HGF)0111$$2StatID$$aWoS$$bScience Citation Index Expanded
000840158 915__ $$0StatID:(DE-HGF)0150$$2StatID$$aDBCoverage$$bWeb of Science Core Collection
000840158 915__ $$0StatID:(DE-HGF)9900$$2StatID$$aIF < 5
000840158 915__ $$0StatID:(DE-HGF)0510$$2StatID$$aOpenAccess
000840158 915__ $$0StatID:(DE-HGF)1150$$2StatID$$aDBCoverage$$bCurrent Contents - Physical, Chemical and Earth Sciences
000840158 915__ $$0StatID:(DE-HGF)0300$$2StatID$$aDBCoverage$$bMedline
000840158 915__ $$0StatID:(DE-HGF)0199$$2StatID$$aDBCoverage$$bThomson Reuters Master Journal List
000840158 920__ $$lyes
000840158 9201_ $$0I:(DE-Juel1)ER-C-2-20170209$$kER-C-2$$lMaterialwissenschaft u. Werkstofftechnik$$x0
000840158 980__ $$ajournal
000840158 980__ $$aVDB
000840158 980__ $$aUNRESTRICTED
000840158 980__ $$aI:(DE-Juel1)ER-C-2-20170209
000840158 9801_ $$aFullTexts