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@ARTICLE{Stroppa:840158,
      author       = {Stroppa, Daniel G and Righetto, Ricardo D and Montoro,
                      Luciano A and Houben, Lothar and Barthel, Juri and Cordeiro,
                      Marco AL and Leite, Edson R and Weng, Weihao and Kiely,
                      Christopher J and Ramirez, Antonio J},
      title        = {{A}ssessment of a nanocrystal 3-{D} morphology by the
                      analysis of single {HAADF}-{HRSTEM} images},
      journal      = {Nanoscale research letters},
      volume       = {8},
      number       = {1},
      issn         = {1556-276X},
      address      = {New York, NY [u.a.]},
      publisher    = {Springer},
      reportid     = {FZJ-2017-07713},
      pages        = {475 -},
      year         = {2013},
      abstract     = {This work presents the morphological characterization of
                      CeO2 nanocrystals by the analysis of single unfiltered
                      high-angle annular dark-field (HAADF)-high-resolution
                      scanning transmission electron microscopy (HRSTEM) images.
                      The thickness of each individual atomic column is estimated
                      by the classification of its HAADF integrated intensity
                      using a Gaussian mixture model. The resulting thickness maps
                      obtained from two example nanocrystals with distinct
                      morphology were analyzed with aid of the symmetry from the
                      CeO2 crystallographic structure, providing an approximation
                      for their 3-D morphology with high spatial resolution. A
                      confidence level of ±1 atom per atomic column along the
                      viewing direction on the thickness estimation is indicated
                      by the use of multislice image simulation. The described
                      characterization procedure stands out as a simple approach
                      for retrieving morphological parameters of individual
                      nanocrystals, such as volume and specific surface areas for
                      different crystalline planes. The procedure is an
                      alternative to the tilt-series tomography technique for a
                      number of nanocrystalline systems, since its application
                      does not require the acquisition of multiple images from the
                      same nanocrystal along different zone axes},
      cin          = {ER-C-2},
      ddc          = {600},
      cid          = {I:(DE-Juel1)ER-C-2-20170209},
      pnm          = {143 - Controlling Configuration-Based Phenomena (POF3-143)},
      pid          = {G:(DE-HGF)POF3-143},
      typ          = {PUB:(DE-HGF)16},
      pubmed       = {pmid:24225330},
      doi          = {10.1186/1556-276X-8-475},
      url          = {https://juser.fz-juelich.de/record/840158},
}