%0 Journal Article
%A Thust, Andreas
%A Barthel, Juri
%T FEI Titan 80 - 300 TEM
%J Journal of large-scale research facilities
%V 2
%@ 2364-091X
%C Jülich
%I Forschungszentrum Jülich
%M FZJ-2017-07727
%P A44
%D 2016
%X The FEI Titan 80-300 TEM is a high-resolution transmission electron microscope equipped with a field emission gun and a corrector for the spherical aberration (CS) of the imaging lens system. The instrument is designed for the investigation of a wide range of solid state phenomena taking place on the atomic scale, which requires true atomic resolution capabilities. Under optimum optical settings of the image CS-corrector (CEOS CETCOR) the point-resolution is extended up to the information limit of well below 100 pm with 200 keV and 300 keV electrons. A special piezo-stage design allows ultra-precise positioning of the specimen in all 3 dimensions. Digital images are acquired with a Gatan 2k x 2k slow-scan charged coupled device camera.
%F PUB:(DE-HGF)16
%9 Journal Article
%R 10.17815/jlsrf-2-66
%U https://juser.fz-juelich.de/record/840172