000840172 001__ 840172
000840172 005__ 20210129231751.0
000840172 0247_ $$2doi$$a10.17815/jlsrf-2-66
000840172 0247_ $$2Handle$$a2128/15962
000840172 037__ $$aFZJ-2017-07727
000840172 041__ $$aEnglish
000840172 082__ $$a620
000840172 1001_ $$0P:(DE-Juel1)131002$$aThust, Andreas$$b0$$eCorresponding author
000840172 245__ $$aFEI Titan 80 - 300 TEM
000840172 260__ $$aJülich$$bForschungszentrum Jülich$$c2016
000840172 3367_ $$2DRIVER$$aarticle
000840172 3367_ $$2DataCite$$aOutput Types/Journal article
000840172 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal$$s1511525772_11654
000840172 3367_ $$2BibTeX$$aARTICLE
000840172 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000840172 3367_ $$00$$2EndNote$$aJournal Article
000840172 520__ $$aThe FEI Titan 80-300 TEM is a high-resolution transmission electron microscope equipped with a field emission gun and a corrector for the spherical aberration (CS) of the imaging lens system. The instrument is designed for the investigation of a wide range of solid state phenomena taking place on the atomic scale, which requires true atomic resolution capabilities. Under optimum optical settings of the image CS-corrector (CEOS CETCOR) the point-resolution is extended up to the information limit of well below 100 pm with 200 keV and 300 keV electrons. A special piezo-stage design allows ultra-precise positioning of the specimen in all 3 dimensions. Digital images are acquired with a Gatan 2k x 2k slow-scan charged coupled device camera.
000840172 536__ $$0G:(DE-HGF)POF3-143$$a143 - Controlling Configuration-Based Phenomena (POF3-143)$$cPOF3-143$$fPOF III$$x0
000840172 7001_ $$0P:(DE-Juel1)130525$$aBarthel, Juri$$b1
000840172 773__ $$0PERI:(DE-600)2810938-7$$a10.17815/jlsrf-2-66$$pA44$$tJournal of large-scale research facilities$$v2$$x2364-091X$$y2016
000840172 8564_ $$uhttps://juser.fz-juelich.de/record/840172/files/66-494-1-PB.pdf$$yOpenAccess
000840172 8564_ $$uhttps://juser.fz-juelich.de/record/840172/files/66-494-1-PB.gif?subformat=icon$$xicon$$yOpenAccess
000840172 8564_ $$uhttps://juser.fz-juelich.de/record/840172/files/66-494-1-PB.jpg?subformat=icon-1440$$xicon-1440$$yOpenAccess
000840172 8564_ $$uhttps://juser.fz-juelich.de/record/840172/files/66-494-1-PB.jpg?subformat=icon-180$$xicon-180$$yOpenAccess
000840172 8564_ $$uhttps://juser.fz-juelich.de/record/840172/files/66-494-1-PB.jpg?subformat=icon-640$$xicon-640$$yOpenAccess
000840172 8564_ $$uhttps://juser.fz-juelich.de/record/840172/files/66-494-1-PB.pdf?subformat=pdfa$$xpdfa$$yOpenAccess
000840172 909CO $$ooai:juser.fz-juelich.de:840172$$pdnbdelivery$$pVDB$$pdriver$$popen_access$$popenaire
000840172 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)131002$$aForschungszentrum Jülich$$b0$$kFZJ
000840172 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)130525$$aForschungszentrum Jülich$$b1$$kFZJ
000840172 9131_ $$0G:(DE-HGF)POF3-143$$1G:(DE-HGF)POF3-140$$2G:(DE-HGF)POF3-100$$3G:(DE-HGF)POF3$$4G:(DE-HGF)POF$$aDE-HGF$$bEnergie$$lFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$vControlling Configuration-Based Phenomena$$x0
000840172 9141_ $$y2017
000840172 915__ $$0StatID:(DE-HGF)0510$$2StatID$$aOpenAccess
000840172 915__ $$0StatID:(DE-HGF)0500$$2StatID$$aDBCoverage$$bDOAJ
000840172 915__ $$0LIC:(DE-HGF)CCBY4$$2HGFVOC$$aCreative Commons Attribution CC BY 4.0
000840172 920__ $$lyes
000840172 9201_ $$0I:(DE-Juel1)ER-C-2-20170209$$kER-C-2$$lMaterialwissenschaft u. Werkstofftechnik$$x0
000840172 980__ $$ajournal
000840172 980__ $$aVDB
000840172 980__ $$aUNRESTRICTED
000840172 980__ $$aI:(DE-Juel1)ER-C-2-20170209
000840172 9801_ $$aFullTexts