TY  - JOUR
AU  - Thust, Andreas
AU  - Barthel, Juri
TI  - FEI Titan 80 - 300 TEM
JO  - Journal of large-scale research facilities
VL  - 2
SN  - 2364-091X
CY  - Jülich
PB  - Forschungszentrum Jülich
M1  - FZJ-2017-07727
SP  - A44
PY  - 2016
AB  - The FEI Titan 80-300 TEM is a high-resolution transmission electron microscope equipped with a field emission gun and a corrector for the spherical aberration (CS) of the imaging lens system. The instrument is designed for the investigation of a wide range of solid state phenomena taking place on the atomic scale, which requires true atomic resolution capabilities. Under optimum optical settings of the image CS-corrector (CEOS CETCOR) the point-resolution is extended up to the information limit of well below 100 pm with 200 keV and 300 keV electrons. A special piezo-stage design allows ultra-precise positioning of the specimen in all 3 dimensions. Digital images are acquired with a Gatan 2k x 2k slow-scan charged coupled device camera.
LB  - PUB:(DE-HGF)16
DO  - DOI:10.17815/jlsrf-2-66
UR  - https://juser.fz-juelich.de/record/840172
ER  -