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@ARTICLE{Thust:840172,
author = {Thust, Andreas and Barthel, Juri},
title = {{FEI} {T}itan 80 - 300 {TEM}},
journal = {Journal of large-scale research facilities},
volume = {2},
issn = {2364-091X},
address = {Jülich},
publisher = {Forschungszentrum Jülich},
reportid = {FZJ-2017-07727},
pages = {A44},
year = {2016},
abstract = {The FEI Titan 80-300 TEM is a high-resolution transmission
electron microscope equipped with a field emission gun and a
corrector for the spherical aberration (CS) of the imaging
lens system. The instrument is designed for the
investigation of a wide range of solid state phenomena
taking place on the atomic scale, which requires true atomic
resolution capabilities. Under optimum optical settings of
the image CS-corrector (CEOS CETCOR) the point-resolution is
extended up to the information limit of well below 100 pm
with 200 keV and 300 keV electrons. A special piezo-stage
design allows ultra-precise positioning of the specimen in
all 3 dimensions. Digital images are acquired with a Gatan
2k x 2k slow-scan charged coupled device camera.},
cin = {ER-C-2},
ddc = {620},
cid = {I:(DE-Juel1)ER-C-2-20170209},
pnm = {143 - Controlling Configuration-Based Phenomena (POF3-143)},
pid = {G:(DE-HGF)POF3-143},
typ = {PUB:(DE-HGF)16},
doi = {10.17815/jlsrf-2-66},
url = {https://juser.fz-juelich.de/record/840172},
}