000840180 001__ 840180
000840180 005__ 20210129231752.0
000840180 0247_ $$2doi$$a10.1017/S1431927617000034
000840180 0247_ $$2ISSN$$a1431-9276
000840180 0247_ $$2ISSN$$a1435-8115
000840180 0247_ $$2pmid$$apmid:28215198
000840180 0247_ $$2WOS$$aWOS:000405595600011
000840180 0247_ $$2Handle$$a2128/19354
000840180 037__ $$aFZJ-2017-07735
000840180 082__ $$a570
000840180 1001_ $$0P:(DE-HGF)0$$aStoffers, Andreas$$b0$$eCorresponding author
000840180 245__ $$aCorrelating Atom Probe Tomography with Atomic-Resolved Scanning Transmission Electron Microscopy: Example of Segregation at Silicon Grain Boundaries
000840180 260__ $$aNew York, NY$$bCambridge University Press$$c2017
000840180 3367_ $$2DRIVER$$aarticle
000840180 3367_ $$2DataCite$$aOutput Types/Journal article
000840180 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal$$s1531743237_26642
000840180 3367_ $$2BibTeX$$aARTICLE
000840180 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000840180 3367_ $$00$$2EndNote$$aJournal Article
000840180 520__ $$aIn the course of a thorough investigation of the performance-structure-chemistry interdependency at silicon grain boundaries, we successfully developed a method to systematically correlate aberration-corrected scanning transmission electron microscopy and atom probe tomography. The correlative approach is conducted on individual APT and TEM specimens, with the option to perform both investigations on the same specimen in the future. In the present case of a Σ9 grain boundary, joint mapping of the atomistic details of the grain boundary topology, in conjunction with chemical decoration, enables a deeper understanding of the segregation of impurities observed at such grain boundaries.
000840180 536__ $$0G:(DE-HGF)POF3-143$$a143 - Controlling Configuration-Based Phenomena (POF3-143)$$cPOF3-143$$fPOF III$$x0
000840180 588__ $$aDataset connected to CrossRef
000840180 7001_ $$0P:(DE-Juel1)130525$$aBarthel, Juri$$b1
000840180 7001_ $$0P:(DE-HGF)0$$aLiebscher, Christian H.$$b2
000840180 7001_ $$00000-0002-4934-0458$$aGault, Baptiste$$b3
000840180 7001_ $$0P:(DE-HGF)0$$aCojocaru-Mirédin, Oana$$b4
000840180 7001_ $$0P:(DE-HGF)0$$aScheu, Christina$$b5
000840180 7001_ $$0P:(DE-HGF)0$$aRaabe, Dierk$$b6
000840180 773__ $$0PERI:(DE-600)1481716-0$$a10.1017/S1431927617000034$$gVol. 23, no. 02, p. 291 - 299$$n02$$p291 - 299$$tMicroscopy and microanalysis$$v23$$x1435-8115$$y2017
000840180 8564_ $$uhttps://juser.fz-juelich.de/record/840180/files/correlating_atom_probe_tomography_with_atomicresolved_scanning_transmission_electron_microscopy_example_of_segregation_at_silicon_grain_boundaries.pdf$$yOpenAccess
000840180 8564_ $$uhttps://juser.fz-juelich.de/record/840180/files/correlating_atom_probe_tomography_with_atomicresolved_scanning_transmission_electron_microscopy_example_of_segregation_at_silicon_grain_boundaries.gif?subformat=icon$$xicon$$yOpenAccess
000840180 8564_ $$uhttps://juser.fz-juelich.de/record/840180/files/correlating_atom_probe_tomography_with_atomicresolved_scanning_transmission_electron_microscopy_example_of_segregation_at_silicon_grain_boundaries.jpg?subformat=icon-1440$$xicon-1440$$yOpenAccess
000840180 8564_ $$uhttps://juser.fz-juelich.de/record/840180/files/correlating_atom_probe_tomography_with_atomicresolved_scanning_transmission_electron_microscopy_example_of_segregation_at_silicon_grain_boundaries.jpg?subformat=icon-180$$xicon-180$$yOpenAccess
000840180 8564_ $$uhttps://juser.fz-juelich.de/record/840180/files/correlating_atom_probe_tomography_with_atomicresolved_scanning_transmission_electron_microscopy_example_of_segregation_at_silicon_grain_boundaries.jpg?subformat=icon-640$$xicon-640$$yOpenAccess
000840180 909CO $$ooai:juser.fz-juelich.de:840180$$pdnbdelivery$$pdriver$$pVDB$$popen_access$$popenaire
000840180 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)130525$$aForschungszentrum Jülich$$b1$$kFZJ
000840180 9131_ $$0G:(DE-HGF)POF3-143$$1G:(DE-HGF)POF3-140$$2G:(DE-HGF)POF3-100$$3G:(DE-HGF)POF3$$4G:(DE-HGF)POF$$aDE-HGF$$bEnergie$$lFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$vControlling Configuration-Based Phenomena$$x0
000840180 9141_ $$y2017
000840180 915__ $$0StatID:(DE-HGF)0200$$2StatID$$aDBCoverage$$bSCOPUS
000840180 915__ $$0StatID:(DE-HGF)1030$$2StatID$$aDBCoverage$$bCurrent Contents - Life Sciences
000840180 915__ $$0StatID:(DE-HGF)0100$$2StatID$$aJCR$$bMICROSC MICROANAL : 2015
000840180 915__ $$0StatID:(DE-HGF)0520$$2StatID$$aAllianz-OA
000840180 915__ $$0StatID:(DE-HGF)0150$$2StatID$$aDBCoverage$$bWeb of Science Core Collection
000840180 915__ $$0StatID:(DE-HGF)0110$$2StatID$$aWoS$$bScience Citation Index
000840180 915__ $$0StatID:(DE-HGF)0111$$2StatID$$aWoS$$bScience Citation Index Expanded
000840180 915__ $$0StatID:(DE-HGF)0510$$2StatID$$aOpenAccess
000840180 915__ $$0StatID:(DE-HGF)9900$$2StatID$$aIF < 5
000840180 915__ $$0StatID:(DE-HGF)0400$$2StatID$$aAllianz-Lizenz / DFG
000840180 915__ $$0StatID:(DE-HGF)1150$$2StatID$$aDBCoverage$$bCurrent Contents - Physical, Chemical and Earth Sciences
000840180 915__ $$0StatID:(DE-HGF)0310$$2StatID$$aDBCoverage$$bNCBI Molecular Biology Database
000840180 915__ $$0StatID:(DE-HGF)1050$$2StatID$$aDBCoverage$$bBIOSIS Previews
000840180 915__ $$0StatID:(DE-HGF)0300$$2StatID$$aDBCoverage$$bMedline
000840180 915__ $$0StatID:(DE-HGF)0420$$2StatID$$aNationallizenz
000840180 915__ $$0StatID:(DE-HGF)0199$$2StatID$$aDBCoverage$$bThomson Reuters Master Journal List
000840180 920__ $$lyes
000840180 9201_ $$0I:(DE-Juel1)ER-C-2-20170209$$kER-C-2$$lMaterialwissenschaft u. Werkstofftechnik$$x0
000840180 980__ $$ajournal
000840180 980__ $$aVDB
000840180 980__ $$aUNRESTRICTED
000840180 980__ $$aI:(DE-Juel1)ER-C-2-20170209
000840180 9801_ $$aFullTexts