TY - JOUR
AU - Stoffers, Andreas
AU - Barthel, Juri
AU - Liebscher, Christian H.
AU - Gault, Baptiste
AU - Cojocaru-Mirédin, Oana
AU - Scheu, Christina
AU - Raabe, Dierk
TI - Correlating Atom Probe Tomography with Atomic-Resolved Scanning Transmission Electron Microscopy: Example of Segregation at Silicon Grain Boundaries
JO - Microscopy and microanalysis
VL - 23
IS - 02
SN - 1435-8115
CY - New York, NY
PB - Cambridge University Press
M1 - FZJ-2017-07735
SP - 291 - 299
PY - 2017
AB - In the course of a thorough investigation of the performance-structure-chemistry interdependency at silicon grain boundaries, we successfully developed a method to systematically correlate aberration-corrected scanning transmission electron microscopy and atom probe tomography. The correlative approach is conducted on individual APT and TEM specimens, with the option to perform both investigations on the same specimen in the future. In the present case of a Σ9 grain boundary, joint mapping of the atomistic details of the grain boundary topology, in conjunction with chemical decoration, enables a deeper understanding of the segregation of impurities observed at such grain boundaries.
LB - PUB:(DE-HGF)16
C6 - pmid:28215198
UR - <Go to ISI:>//WOS:000405595600011
DO - DOI:10.1017/S1431927617000034
UR - https://juser.fz-juelich.de/record/840180
ER -