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@ARTICLE{Stoffers:840180,
author = {Stoffers, Andreas and Barthel, Juri and Liebscher,
Christian H. and Gault, Baptiste and Cojocaru-Mirédin, Oana
and Scheu, Christina and Raabe, Dierk},
title = {{C}orrelating {A}tom {P}robe {T}omography with
{A}tomic-{R}esolved {S}canning {T}ransmission {E}lectron
{M}icroscopy: {E}xample of {S}egregation at {S}ilicon
{G}rain {B}oundaries},
journal = {Microscopy and microanalysis},
volume = {23},
number = {02},
issn = {1435-8115},
address = {New York, NY},
publisher = {Cambridge University Press},
reportid = {FZJ-2017-07735},
pages = {291 - 299},
year = {2017},
abstract = {In the course of a thorough investigation of the
performance-structure-chemistry interdependency at silicon
grain boundaries, we successfully developed a method to
systematically correlate aberration-corrected scanning
transmission electron microscopy and atom probe tomography.
The correlative approach is conducted on individual APT and
TEM specimens, with the option to perform both
investigations on the same specimen in the future. In the
present case of a Σ9 grain boundary, joint mapping of the
atomistic details of the grain boundary topology, in
conjunction with chemical decoration, enables a deeper
understanding of the segregation of impurities observed at
such grain boundaries.},
cin = {ER-C-2},
ddc = {570},
cid = {I:(DE-Juel1)ER-C-2-20170209},
pnm = {143 - Controlling Configuration-Based Phenomena (POF3-143)},
pid = {G:(DE-HGF)POF3-143},
typ = {PUB:(DE-HGF)16},
pubmed = {pmid:28215198},
UT = {WOS:000405595600011},
doi = {10.1017/S1431927617000034},
url = {https://juser.fz-juelich.de/record/840180},
}