Correlating Atom Probe Tomography with Atomic-Resolved Scanning Transmission Electron Microscopy: Example of Segregation at Silicon Grain Boundaries

Correlating Atom Probe Tomography with Atomic-Resolved Scanning Transmission Electron Microscopy: Example of Segregation at Silicon Grain Boundaries - FZJ-2017-07735

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correlating_atom_probe_tomography_with_atomicresolved_scanning_transmission_electron_microscopy_example_of_segregation_at_silicon_grain_boundaries

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correlating_atom_probe_tomography_with_atomicresolved_scanning_transmission_electron_microscopy_example_of_segregation_at_silicon_grain_boundaries.gif (icon)	[12.96 KB] 16 Jul 2018, 14:14	OpenAccess
correlating_atom_probe_tomography_with_atomicresolved_scanning_transmission_electron_microscopy_example_of_segregation_at_silicon_grain_boundaries.jpg (icon-1440)	[242.92 KB] 16 Jul 2018, 14:14	OpenAccess
correlating_atom_probe_tomography_with_atomicresolved_scanning_transmission_electron_microscopy_example_of_segregation_at_silicon_grain_boundaries.jpg (icon-180)	[26.62 KB] 16 Jul 2018, 14:14	OpenAccess
correlating_atom_probe_tomography_with_atomicresolved_scanning_transmission_electron_microscopy_example_of_segregation_at_silicon_grain_boundaries.jpg (icon-640)	[242.92 KB] 16 Jul 2018, 14:14	OpenAccess
correlating_atom_probe_tomography_with_atomicresolved_scanning_transmission_electron_microscopy_example_of_segregation_at_silicon_grain_boundaries.pdf	[1.27 MB] 16 Jul 2018, 14:14	OpenAccess

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