000841485 001__ 841485
000841485 005__ 20210129232022.0
000841485 0247_ $$2doi$$a10.1088/1361-648X/aa8d48
000841485 0247_ $$2ISSN$$a0953-8984
000841485 0247_ $$2ISSN$$a1361-648X
000841485 0247_ $$2pmid$$apmid:29094678
000841485 0247_ $$2WOS$$aWOS:000423777100001
000841485 037__ $$aFZJ-2017-08529
000841485 041__ $$aEnglish
000841485 082__ $$a530
000841485 1001_ $$0P:(DE-HGF)0$$aZhukov, A. A.$$b0$$eCorresponding author
000841485 245__ $$aStability of charged density waves in InAs nanowires in an external magnetic field
000841485 260__ $$aBristol$$bIOP Publ.$$c2017
000841485 3367_ $$2DRIVER$$aarticle
000841485 3367_ $$2DataCite$$aOutput Types/Journal article
000841485 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal$$s1516103494_14951
000841485 3367_ $$2BibTeX$$aARTICLE
000841485 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000841485 3367_ $$00$$2EndNote$$aJournal Article
000841485 520__ $$aWe report on magnetotransport measurements at $T=4.2$ K in a high-quality InAs nanowire ($R_{\rm wire} \sim 20$ kΩ) in the presence of the charged tip of an atomic force microscope serving as a mobile gate. We demonstrate the crucial role of the external magnetic field on the amplitude of the charge density waves with a wavelength of 0.8 μm. The observed suppression rate of their amplitude is similar or slightly higher than the one for weak localization correction in our investigated InAs nanowire.
000841485 536__ $$0G:(DE-HGF)POF3-521$$a521 - Controlling Electron Charge-Based Phenomena (POF3-521)$$cPOF3-521$$fPOF III$$x0
000841485 588__ $$aDataset connected to CrossRef
000841485 65027 $$0V:(DE-MLZ)SciArea-120$$2V:(DE-HGF)$$aCondensed Matter Physics$$x0
000841485 65017 $$0V:(DE-MLZ)GC-1601-2016$$2V:(DE-HGF)$$aEngineering, Industrial Materials and Processing$$x0
000841485 65017 $$0V:(DE-MLZ)GC-120-2016$$2V:(DE-HGF)$$aInformation and Communication$$x1
000841485 7001_ $$0P:(DE-Juel1)128643$$aVolk, Christian$$b1
000841485 7001_ $$0P:(DE-Juel1)144014$$aWinden, Andreas$$b2
000841485 7001_ $$0P:(DE-Juel1)125593$$aHardtdegen, Hilde$$b3
000841485 7001_ $$0P:(DE-Juel1)128634$$aSchäpers, Thomas$$b4
000841485 773__ $$0PERI:(DE-600)1472968-4$$a10.1088/1361-648X/aa8d48$$gVol. 29, no. 47, p. 475601 -$$n47$$p475601 -$$tJournal of physics / Condensed matter$$v29$$x1361-648X$$y2017
000841485 8564_ $$uhttps://juser.fz-juelich.de/record/841485/files/Zhukov_2017_J._Phys.__Condens._Matter_29_475601-1.pdf$$yRestricted
000841485 8564_ $$uhttps://juser.fz-juelich.de/record/841485/files/Zhukov_2017_J._Phys.__Condens._Matter_29_475601-1.gif?subformat=icon$$xicon$$yRestricted
000841485 8564_ $$uhttps://juser.fz-juelich.de/record/841485/files/Zhukov_2017_J._Phys.__Condens._Matter_29_475601-1.jpg?subformat=icon-1440$$xicon-1440$$yRestricted
000841485 8564_ $$uhttps://juser.fz-juelich.de/record/841485/files/Zhukov_2017_J._Phys.__Condens._Matter_29_475601-1.jpg?subformat=icon-180$$xicon-180$$yRestricted
000841485 8564_ $$uhttps://juser.fz-juelich.de/record/841485/files/Zhukov_2017_J._Phys.__Condens._Matter_29_475601-1.jpg?subformat=icon-640$$xicon-640$$yRestricted
000841485 8564_ $$uhttps://juser.fz-juelich.de/record/841485/files/Zhukov_2017_J._Phys.__Condens._Matter_29_475601-1.pdf?subformat=pdfa$$xpdfa$$yRestricted
000841485 909CO $$ooai:juser.fz-juelich.de:841485$$pVDB
000841485 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)128643$$aForschungszentrum Jülich$$b1$$kFZJ
000841485 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)125593$$aForschungszentrum Jülich$$b3$$kFZJ
000841485 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)128634$$aForschungszentrum Jülich$$b4$$kFZJ
000841485 9131_ $$0G:(DE-HGF)POF3-521$$1G:(DE-HGF)POF3-520$$2G:(DE-HGF)POF3-500$$3G:(DE-HGF)POF3$$4G:(DE-HGF)POF$$aDE-HGF$$bKey Technologies$$lFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$vControlling Electron Charge-Based Phenomena$$x0
000841485 9141_ $$y2017
000841485 915__ $$0StatID:(DE-HGF)0420$$2StatID$$aNationallizenz
000841485 915__ $$0StatID:(DE-HGF)0430$$2StatID$$aNational-Konsortium
000841485 915__ $$0StatID:(DE-HGF)0300$$2StatID$$aDBCoverage$$bMedline
000841485 915__ $$0StatID:(DE-HGF)0310$$2StatID$$aDBCoverage$$bNCBI Molecular Biology Database
000841485 915__ $$0StatID:(DE-HGF)0100$$2StatID$$aJCR$$bJ PHYS-CONDENS MAT : 2015
000841485 915__ $$0StatID:(DE-HGF)0200$$2StatID$$aDBCoverage$$bSCOPUS
000841485 915__ $$0StatID:(DE-HGF)0199$$2StatID$$aDBCoverage$$bThomson Reuters Master Journal List
000841485 915__ $$0StatID:(DE-HGF)0110$$2StatID$$aWoS$$bScience Citation Index
000841485 915__ $$0StatID:(DE-HGF)0150$$2StatID$$aDBCoverage$$bWeb of Science Core Collection
000841485 915__ $$0StatID:(DE-HGF)0111$$2StatID$$aWoS$$bScience Citation Index Expanded
000841485 915__ $$0StatID:(DE-HGF)1150$$2StatID$$aDBCoverage$$bCurrent Contents - Physical, Chemical and Earth Sciences
000841485 915__ $$0StatID:(DE-HGF)9900$$2StatID$$aIF < 5
000841485 920__ $$lyes
000841485 9201_ $$0I:(DE-Juel1)PGI-9-20110106$$kPGI-9$$lHalbleiter-Nanoelektronik$$x0
000841485 9201_ $$0I:(DE-82)080009_20140620$$kJARA-FIT$$lJARA-FIT$$x1
000841485 980__ $$ajournal
000841485 980__ $$aVDB
000841485 980__ $$aI:(DE-Juel1)PGI-9-20110106
000841485 980__ $$aI:(DE-82)080009_20140620
000841485 980__ $$aUNRESTRICTED