TY  - JOUR
AU  - Duchon, Tomas
AU  - Hackl, Johanna
AU  - Höcker, Jan
AU  - Veltruská, Kateřina
AU  - Matolín, Vladimír
AU  - Falta, Jens
AU  - Cramm, Stefan
AU  - Nemšák, Slavomír
AU  - Schneider, Claus M.
AU  - Flege, Jan Ingo
AU  - Senanayake, Sanjaya D.
TI  - Exploiting micro-scale structural and chemical observations in real time for understanding chemical conversion: LEEM/PEEM studies over CeO x –Cu(111)
JO  - Ultramicroscopy
VL  - 183
SN  - 0304-3991
CY  - Amsterdam
PB  - Elsevier Science
M1  - FZJ-2018-00352
SP  - 84 - 88
PY  - 2017
AB  - Proper consideration of length-scales is critical for elucidating active sites/phases in heterogeneous catalysis, revealing chemical function of surfaces and identifying fundamental steps of chemical reactions. Using the example of ceria thin films deposited on the Cu(111) surface, we demonstrate the benefits of multi length-scale experimental framework for understanding chemical conversion. Specifically, exploiting the tunable sampling and spatial resolution of photoemission electron microscopy, we reveal crystal defect mediated structures of inhomogeneous copper–ceria mixed phase that grow during preparation of ceria/Cu(111) model systems. The density of the microsized structures is such that they are relevant to the chemistry, but unlikely to be found during investigation at the nanoscale or with atomic level investigations. Our findings highlight the importance of accessing micro-scale when considering chemical pathways over heteroepitaxially grown model systems.
LB  - PUB:(DE-HGF)16
C6  - pmid:28522241
UR  - <Go to ISI:>//WOS:000415578200015
DO  - DOI:10.1016/j.ultramic.2017.05.003
UR  - https://juser.fz-juelich.de/record/842071
ER  -