% IMPORTANT: The following is UTF-8 encoded. This means that in the presence
% of non-ASCII characters, it will not work with BibTeX 0.99 or older.
% Instead, you should use an up-to-date BibTeX implementation like “bibtex8” or
% “biber”.
@MASTERSTHESIS{Schleenvoigt:842814,
author = {Schleenvoigt, Michael},
title = {{Q}uality {I}mprovement of {M}olecular {B}eam {E}pitaxy
{G}rown {T}opological {I}nsulator {T}hin {F}ilms and in situ
{F}abrication of {D}evices},
school = {RWTH Aachen University},
type = {Masterarbeit},
reportid = {FZJ-2018-01010},
pages = {82},
year = {2017},
note = {Masterarbeit, RWTH Aachen University, 2017},
abstract = {In 2005, Kane and Mele introduced topological insulators as
a new material class in the vast field of solid state
physics. Since then, research on the topic led to a plethora
of discoveries, ranging from two-dimensional systems to many
classes of three-dimensional topological insulators.
Topological insulators exhibit promising features, useful
for example for spintronic applications or quantum
computing. However, due to large background doping, these
features are often suppressed. Therefore, measures need to
be taken in order to lower the doping, enhancing the
topological characteristics.In this thesis, molecular beam
epitaxy grown three-dimensional topological insulators of
the tetradymite crystal class, consisting of bismuth,
antimony, tellurium and selenium (V2VI3), are investigated.
In the course of the work, three points of interest in a
conventional sample are investigated with regard to the
possibility to improve them. These are the interface to the
substrate, the bulk and the interface to the
environment.First, the interface of the grown film to the
substrate has been examined. Two approaches have been
pursued to influence the growth of the film. One has been
the use of prepatterned samples to grow topological
insulator films in fixed structures. The other has been
changing the substrate material and growing thin layers of
optimized films, fit to the new surfaces, as pseudo
substrates for subsequent growths.Next, the focus has been
set on the bulk of the film. In order to optimize the
electronic qualities of the topological insulator, a
quaternary material system has been grown via molecular beam
epitaxy. The quaternary system promises less background
doping and has not been grown by the means of molecular beam
epitaxy before.Thirdly, the interface to ambient conditions
has been investigated. To protect the surface of the film
from contaminations during ex situ processes, a technique to
fabricate devices in situ, the stencil lithography, has been
refined. The masks used for the technique have been
fabricated by etching onto structures patterned into silicon
nitride.Lastly, to conclude the two previous chapters, Hall
measurements have been performed on quaternary samples with
in situ contacts grown via the stencil lithography method.
The measurements have been performed at cryogenic
temperatures and resulted in values comparable to
literature.},
cin = {PGI-9},
cid = {I:(DE-Juel1)PGI-9-20110106},
pnm = {521 - Controlling Electron Charge-Based Phenomena
(POF3-521)},
pid = {G:(DE-HGF)POF3-521},
typ = {PUB:(DE-HGF)19},
url = {https://juser.fz-juelich.de/record/842814},
}