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@INPROCEEDINGS{Funck:843945,
      author       = {Funck, Carsten and Hoffmann-Eifert, Susanne and Menzel,
                      Stephan and Waser, R.},
      title        = {{M}echanism for threshold siwtching in {N}b{O}x},
      reportid     = {FZJ-2018-01468},
      year         = {2017},
      month         = {Sep},
      date          = {2017-09-21},
      organization  = {7th imec-Stanford International
                       Workshop on Resistive Switching
                       Memories, Leuven (Belgium), 21 Sep 2017
                       - 22 Sep 2017},
      subtyp        = {Other},
      cin          = {PGI-7 / JARA-FIT},
      cid          = {I:(DE-Juel1)PGI-7-20110106 / $I:(DE-82)080009_20140620$},
      pnm          = {521 - Controlling Electron Charge-Based Phenomena
                      (POF3-521)},
      pid          = {G:(DE-HGF)POF3-521},
      typ          = {PUB:(DE-HGF)6},
      url          = {https://juser.fz-juelich.de/record/843945},
}