TY - CONF
AU - Kentzinger, Emmanuel
AU - Rücker, Ulrich
AU - Qdemat, Asma
AU - Brückel, Thomas
TI - Nanoscience crystallography at a high brilliance laboratory X-ray diffractometer: from mesoscopic to atomic length scales
M1 - FZJ-2018-01870
PY - 2018
T2 - 26th Annual Meeting of the German Crystallographic Society (DGK)
CY - 5 Mar 2018 - 8 Mar 2018, Duisburg-Essen (Germany)
Y2 - 5 Mar 2018 - 8 Mar 2018
M2 - Duisburg-Essen, Germany
LB - PUB:(DE-HGF)6
UR - https://juser.fz-juelich.de/record/844455
ER -