TY  - CONF
AU  - Kentzinger, Emmanuel
AU  - Rücker, Ulrich
AU  - Qdemat, Asma
AU  - Brückel, Thomas
TI  - Nanoscience crystallography at a high brilliance laboratory X-ray diffractometer: from mesoscopic to atomic length scales
M1  - FZJ-2018-01870
PY  - 2018
T2  - 26th Annual Meeting of the German Crystallographic Society (DGK)
CY  - 5 Mar 2018 - 8 Mar 2018, Duisburg-Essen (Germany)
Y2  - 5 Mar 2018 - 8 Mar 2018
M2  - Duisburg-Essen, Germany
LB  - PUB:(DE-HGF)6
UR  - https://juser.fz-juelich.de/record/844455
ER  -