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@ARTICLE{vanStraaten:844985,
      author       = {van Straaten, Gerben and Franke, Markus and Posseik,
                      Francois and Tautz, Frank Stefan and Kumpf, Christian},
      title        = {{N}on-dipolar effects in photoelectron-based normal
                      incidence {X}-ray standing wave experiments},
      journal      = {Journal of electron spectroscopy and related phenomena},
      volume       = {222},
      issn         = {0368-2048},
      address      = {New York, NY [u.a.]},
      publisher    = {Elsevier},
      reportid     = {FZJ-2018-02320},
      pages        = {106 - 116},
      year         = {2018},
      abstract     = {The normal incidence X-ray standing waves technique is one
                      of the most well-established methods for investigating the
                      geometric structure at interfaces and surfaces. It is able
                      to measure vertical positions and distances of individual
                      atomic species with very high precision (typically <0.02
                      Å). These data not only yield valuable structural
                      information, but also represent an excellent benchmark for
                      density functional theory and ab initio calculations.
                      Non-dipolar effects are well known to strongly affect the
                      result, in particular when light elements are involved. A
                      correction mechanism for these effects is established, but
                      in its commonly-used form it is based on one essential
                      restriction, namely the assumption of perfect normal
                      incidence of the X-rays with respect to the relevant lattice
                      planes of the crystal. Here, we show that small deviations
                      from normal incidence, as they are unavoidable in typical
                      experimental setups, lead to significant systematic errors
                      in the NIXSW results. The magnitude of this effect depends
                      on the specific conditions in a non-linear way and may reach
                      up to $5\%,$ corresponding to several tenths of an
                      Ångström in the adsorption height. We present a
                      straightforward way of accounting for this effect, and
                      demonstrate that recording the photoelectron yield in an
                      angular-resolved mode is indispensable, since the correction
                      parameters strongly depend on the electron take-off angle.},
      cin          = {PGI-3},
      ddc          = {620},
      cid          = {I:(DE-Juel1)PGI-3-20110106},
      pnm          = {143 - Controlling Configuration-Based Phenomena (POF3-143)},
      pid          = {G:(DE-HGF)POF3-143},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000423638100015},
      doi          = {10.1016/j.elspec.2017.07.007},
      url          = {https://juser.fz-juelich.de/record/844985},
}