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000845724 1001_ $$0P:(DE-Juel1)161387$$aWinkler, Florian$$b0$$eCorresponding author
000845724 245__ $$aAbsolute Scale Quantitative Off-Axis Electron Holography at Atomic Resolution
000845724 260__ $$aCollege Park, Md.$$bAPS$$c2018
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000845724 520__ $$aAn absolute scale match between experiment and simulation in atomic-resolution off-axis electron holography is demonstrated, with unknown experimental parameters determined directly from the recorded electron wave function using an automated numerical algorithm. We show that the local thickness and tilt of a pristine thin WSe2 flake can be measured uniquely, whereas some electron optical aberrations cannot be determined unambiguously for a periodic object. The ability to determine local specimen and imaging parameters directly from electron wave functions is of great importance for quantitative studies of electrostatic potentials in nanoscale materials, in particular when performing in situ experiments and considering that aberrations change over time.
000845724 536__ $$0G:(DE-HGF)POF3-143$$a143 - Controlling Configuration-Based Phenomena (POF3-143)$$cPOF3-143$$fPOF III$$x0
000845724 536__ $$0G:(DE-Juel1)jpgi90_20150501$$aFirst principle calculations of transition metal dichalcogenides for spin-optoelectronics (jpgi90_20150501)$$cjpgi90_20150501$$fFirst principle calculations of transition metal dichalcogenides for spin-optoelectronics$$x1
000845724 536__ $$0G:(DE-Juel1)jias16_20141101$$aNovel materials for nanoelectronics and spintronics: first principle investigation. (jias16_20141101)$$cjias16_20141101$$fNovel materials for nanoelectronics and spintronics: first principle investigation.$$x2
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000845724 7001_ $$0P:(DE-Juel1)157886$$aTavabi, Amir H.$$b2
000845724 7001_ $$0P:(DE-Juel1)164287$$aBorghardt, Sven$$b3
000845724 7001_ $$0P:(DE-Juel1)145316$$aKardynal, Beata$$b4
000845724 7001_ $$0P:(DE-Juel1)144121$$aDunin-Borkowski, Rafal$$b5
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