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| Hauptseite > Publikationsdatenbank > UV radiation enhanced oxygen vacancy formation caused by the PLD plasma plume > print |
| Hauptseite > Publikationsdatenbank > UV radiation enhanced oxygen vacancy formation caused by the PLD plasma plume > print |
| 001 | 848173 | ||
| 005 | 20220930130150.0 | ||
| 024 | 7 | _ | |a 10.1038/s41598-018-27207-5 |2 doi |
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| 037 | _ | _ | |a FZJ-2018-03439 |
| 082 | _ | _ | |a 000 |
| 100 | 1 | _ | |a Hensling, Felix |0 P:(DE-Juel1)165926 |b 0 |e Corresponding author |
| 245 | _ | _ | |a UV radiation enhanced oxygen vacancy formation caused by the PLD plasma plume |
| 260 | _ | _ | |a London |c 2018 |b Nature Publishing Group |
| 336 | 7 | _ | |a article |2 DRIVER |
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| 520 | _ | _ | |a Pulsed Laser Deposition is a commonly used non-equilibrium physical deposition technique for the growth of complex oxide thin films. A wide range of parameters is known to influence the properties of the used samples and thin films, especially the oxygen-vacancy concentration. One parameter has up to this point been neglected due to the challenges of separating its influence from the influence of the impinging species during growth: the UV-radiation of the plasma plume. We here present experiments enabled by a specially designed holder to allow a separation of these two influences. The influence of the UV-irradiation during pulsed laser deposition on the formation of oxygen-vacancies is investigated for the perovskite model material SrTiO3. The carrier concentration of UV-irradiated samples is nearly constant with depth and time. By contrast samples not exposed to the radiation of the plume show a depth dependence and a decrease in concentration over time. We reveal an increase in Ti-vacancy–oxygen-vacancy-complexes for UV irradiated samples, consistent with the different carrier concentrations. We find a UV enhanced oxygen-vacancy incorporation rate as responsible mechanism. We provide a complete picture of another influence parameter to be considered during pulsed laser depositions and unravel the mechanism behind persistent-photo-conductivity in SrTiO3. |
| 536 | _ | _ | |a 521 - Controlling Electron Charge-Based Phenomena (POF3-521) |0 G:(DE-HGF)POF3-521 |c POF3-521 |f POF III |x 0 |
| 588 | _ | _ | |a Dataset connected to CrossRef |
| 700 | 1 | _ | |a Keeble, D. J. |0 P:(DE-HGF)0 |b 1 |
| 700 | 1 | _ | |a Zhu, J. |0 P:(DE-Juel1)142452 |b 2 |
| 700 | 1 | _ | |a Brose, S. |0 P:(DE-HGF)0 |b 3 |
| 700 | 1 | _ | |a Xu, C. |0 P:(DE-Juel1)156312 |b 4 |
| 700 | 1 | _ | |a Gunkel, F. |0 P:(DE-Juel1)130677 |b 5 |
| 700 | 1 | _ | |a Danylyuk, S. |0 P:(DE-HGF)0 |b 6 |
| 700 | 1 | _ | |a Nonnenmann, S. S. |0 0000-0002-5369-9279 |b 7 |
| 700 | 1 | _ | |a Egger, W. |0 P:(DE-HGF)0 |b 8 |
| 700 | 1 | _ | |a Dittmann, R. |0 P:(DE-Juel1)130620 |b 9 |
| 773 | _ | _ | |a 10.1038/s41598-018-27207-5 |g Vol. 8, no. 1, p. 8846 |0 PERI:(DE-600)2615211-3 |n 1 |p 8846 |t Scientific reports |v 8 |y 2018 |x 2045-2322 |
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