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Conference Presentation (Invited) FZJ-2018-03661
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Uncovering switching and failure mechanisms in memristive devices by in-operando spectromicroscopy

 ;

2017

AVS 64th Int. Symp. & Exhibition, Tampa, FloridaTampa, Florida, USA, 29 Oct 2017 - 3 Nov 20172017-10-292017-11-03

Contributing Institute(s):
  1. Elektronische Materialien (PGI-7)
  2. JARA-FIT (JARA-FIT)
Research Program(s):
  1. 521 - Controlling Electron Charge-Based Phenomena (POF3-521) (POF3-521)

Appears in the scientific report 2018
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The record appears in these collections:
Document types > Presentations > Conference Presentations
JARA > JARA > JARA-JARA\-FIT
Institute Collections > PGI > PGI-7
Workflow collections > Public records
Publications database
 Record created 2018-06-21, last modified 2021-01-29
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