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@ARTICLE{Grieb:850202,
      author       = {Grieb, Tim and Krause, Florian F. and Schowalter, Marco and
                      Zillmann, Dennis and Sellin, Roman and Müller-Caspary, Knut
                      and Mahr, Christoph and Mehrtens, Thorsten and Bimberg,
                      Dieter and Rosenauer, Andreas},
      title        = {{S}train analysis from nano-beam electron diffraction:
                      {I}nfluence of specimen tilt and beam convergence},
      journal      = {Ultramicroscopy},
      volume       = {190},
      issn         = {0304-3991},
      address      = {Amsterdam},
      publisher    = {Elsevier Science},
      reportid     = {FZJ-2018-04276},
      pages        = {45 - 57},
      year         = {2018},
      abstract     = {Strain analyses from experimental series of nano-beam
                      electron diffraction (NBED) patterns in scanning
                      transmission electron microscopy are performed for different
                      specimen tilts. Simulations of NBED series are presented for
                      which strain analysis gives results that are in accordance
                      with experiment. This consequently allows to study the
                      relation between measured strain and actual underlying
                      strain. A two-tilt method which can be seen as lowest-order
                      electron beam precession is suggested and experimentally
                      implemented. Strain determination from NBED series with
                      increasing beam convergence is performed in combination with
                      the experimental realization of a probe-forming aperture
                      with a cross inside. It is shown that using standard
                      evaluation techniques, the influence of beam convergence on
                      spatial resolution is lower than the influence of sharp
                      rings around the diffraction disc which occur at interfaces
                      and which are caused by the tails of the intensity
                      distribution of the electron probe.},
      cin          = {ER-C-1},
      ddc          = {570},
      cid          = {I:(DE-Juel1)ER-C-1-20170209},
      pnm          = {143 - Controlling Configuration-Based Phenomena (POF3-143)},
      pid          = {G:(DE-HGF)POF3-143},
      typ          = {PUB:(DE-HGF)16},
      pubmed       = {pmid:29783102},
      UT           = {WOS:000432868800006},
      doi          = {10.1016/j.ultramic.2018.03.013},
      url          = {https://juser.fz-juelich.de/record/850202},
}