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@ARTICLE{Denneulin:851001,
      author       = {Denneulin, T. and Wollschläger, N. and Everhardt, A. S.
                      and Farokhipoor, S. and Noheda, B. and Snoeck, E. and
                      Hÿtch, M.},
      title        = {{L}ocal deformation gradients in epitaxial {P}b({Z}r 0.2
                      {T}i 0.8 ){O} 3 layers investigated by transmission electron
                      microscopy},
      journal      = {Journal of physics / Condensed matter},
      volume       = {30},
      number       = {21},
      issn         = {1361-648X},
      address      = {Bristol},
      publisher    = {IOP Publ.},
      reportid     = {FZJ-2018-04720},
      pages        = {215701 -},
      year         = {2018},
      abstract     = {Lead zirconate titanate samples are used for their
                      piezoelectric and ferroelectric properties in various types
                      of micro-devices. Epitaxial layers of tetragonal perovskites
                      have a tendency to relax by forming ferroelastic domains.
                      The accommodation of the a/c/a/c polydomain structure on a
                      flat substrate leads to nanoscale deformation gradients
                      which locally influence the polarization by flexoelectric
                      effect. Here, we investigated the deformation fields in
                      epitaxial layers of Pb(Zr0.2Ti0.8)O3 grown on SrTiO3
                      substrates using transmission electron microscopy (TEM). We
                      found that the deformation gradients depend on the domain
                      walls inclination ( or to the substrate interface) of the
                      successive domains and we describe three different a/c/a
                      domain configurations: one configuration with parallel
                      a-domains and two configurations with perpendicular
                      a-domains (V-shaped and hat--shaped). In the parallel
                      configuration, the c-domains contain horizontal and vertical
                      gradients of out-of-plane deformation. In the V-shaped and
                      hat--shaped configurations, the c-domains exhibit a bending
                      deformation field with vertical gradients of in-plane
                      deformation. Each of these configurations is expected to
                      have a different influence on the polarization and so the
                      local properties of the film. The deformation gradients were
                      measured using dark-field electron holography, a TEM
                      technique, which offers a good sensitivity $(0.1\%)$ and a
                      large field-of-view (hundreds of nanometers). The
                      measurements are compared with finite element simulations.},
      cin          = {PGI-5},
      ddc          = {530},
      cid          = {I:(DE-Juel1)PGI-5-20110106},
      pnm          = {143 - Controlling Configuration-Based Phenomena (POF3-143)},
      pid          = {G:(DE-HGF)POF3-143},
      typ          = {PUB:(DE-HGF)16},
      pubmed       = {pmid:29633959},
      UT           = {WOS:000431264300001},
      doi          = {10.1088/1361-648X/aabd00},
      url          = {https://juser.fz-juelich.de/record/851001},
}