%0 Conference Paper
%A Müller-Caspary, Knut
%A Duchamp, Martial
%A Béché, Armand
%A Migunov, Vadim
%A van den Bos, Karel
%A Krause, Florian
%A Soltau, Heike
%A Strüder, Lothar
%A Zweck, Josef
%A Schattschneider, Peter
%A Dunin-Borkowski, Rafal
%A Verbeeck, Johan
%A Rosenauer, Andreas
%A van Aert, Sandra
%T Mapping composition, tickness, charge density, valency: Concepts and applications of momentum-resolved STEM
%M FZJ-2018-04730
%D 2018
%B Sino-German symposium on advanced electron microscopy and spectroscopy
%C 19 Apr 2018 - 22 Apr 2018, Bejing (China)
Y2 19 Apr 2018 - 22 Apr 2018
M2 Bejing, China
%F PUB:(DE-HGF)6
%9 Conference Presentation
%U https://juser.fz-juelich.de/record/851016