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@ARTICLE{delaPena:851319,
author = {de la Pena, Francisco and Ostasevicius, Tomas and Tonaas
Fauske, Vidar and Burdet, Pierre and Jokubauskas, Petras and
Nord, Magnus and Sarahan, Mike and Prestat, Eric and
Johnstone, Duncan N. and Taillon, Joshua and Caron, Jan and
Furnival, Tom and MacArthur, Katherine and Eljarrat, Alberto
and Mazzucco, Stefano and Migunov, Vadim and Aarholt, Thomas
and Walls, Michael and Winkler, Florian and Donval, Gael and
Martineau, Ben and Garmannslund, Andreas and Zagonel,
Luiz-Fernando and Iyengar, Ilya},
title = {{E}lectron {M}icroscopy ({B}ig and {S}mall) {D}ata
{A}nalysis {W}ith the {O}pen {S}ource {S}oftware {P}ackage
{H}yper{S}py},
journal = {Microscopy and microanalysis},
volume = {23},
number = {S1},
issn = {1435-8115},
address = {New York, NY},
publisher = {Cambridge University Press},
reportid = {FZJ-2018-05005},
pages = {214 - 215},
year = {2017},
cin = {ER-C-2},
ddc = {570},
cid = {I:(DE-Juel1)ER-C-2-20170209},
pnm = {143 - Controlling Configuration-Based Phenomena (POF3-143)},
pid = {G:(DE-HGF)POF3-143},
typ = {PUB:(DE-HGF)16},
doi = {10.1017/S1431927617001751},
url = {https://juser.fz-juelich.de/record/851319},
}