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@ARTICLE{delaPena:851319,
      author       = {de la Pena, Francisco and Ostasevicius, Tomas and Tonaas
                      Fauske, Vidar and Burdet, Pierre and Jokubauskas, Petras and
                      Nord, Magnus and Sarahan, Mike and Prestat, Eric and
                      Johnstone, Duncan N. and Taillon, Joshua and Caron, Jan and
                      Furnival, Tom and MacArthur, Katherine and Eljarrat, Alberto
                      and Mazzucco, Stefano and Migunov, Vadim and Aarholt, Thomas
                      and Walls, Michael and Winkler, Florian and Donval, Gael and
                      Martineau, Ben and Garmannslund, Andreas and Zagonel,
                      Luiz-Fernando and Iyengar, Ilya},
      title        = {{E}lectron {M}icroscopy ({B}ig and {S}mall) {D}ata
                      {A}nalysis {W}ith the {O}pen {S}ource {S}oftware {P}ackage
                      {H}yper{S}py},
      journal      = {Microscopy and microanalysis},
      volume       = {23},
      number       = {S1},
      issn         = {1435-8115},
      address      = {New York, NY},
      publisher    = {Cambridge University Press},
      reportid     = {FZJ-2018-05005},
      pages        = {214 - 215},
      year         = {2017},
      cin          = {ER-C-2},
      ddc          = {570},
      cid          = {I:(DE-Juel1)ER-C-2-20170209},
      pnm          = {143 - Controlling Configuration-Based Phenomena (POF3-143)},
      pid          = {G:(DE-HGF)POF3-143},
      typ          = {PUB:(DE-HGF)16},
      doi          = {10.1017/S1431927617001751},
      url          = {https://juser.fz-juelich.de/record/851319},
}