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@ARTICLE{Chen:852522,
      author       = {Chen, Chunguang and Oudenhoven, Jos F. M. and Danilov,
                      Dmitri and Vezhlev, Egor and Gao, Lu and Li, Na and Mulder,
                      Fokko M. and Eichel, Rüdiger-A. and Notten, Peter H. L.},
      title        = {{O}rigin of {D}egradation in {S}i-{B}ased
                      {A}ll-{S}olid-{S}tate {L}i-{I}on {M}icrobatteries},
      journal      = {Advanced energy materials},
      volume       = {8},
      number       = {30},
      issn         = {1614-6832},
      address      = {Weinheim},
      publisher    = {Wiley-VCH},
      reportid     = {FZJ-2018-05450},
      pages        = {1801430},
      year         = {2018},
      abstract     = {Like all rechargeable battery systems, conventional
                      Li‐ion batteries (LIB) inevitably suffer from capacity
                      losses during operation. This also holds for
                      all‐solid‐state LIB. In this contribution an in operando
                      neutron depth profiling method is developed to investigate
                      the degradation mechanism of all‐solid‐state, thin film
                      Si–Li3PO4–LiCoO2 batteries. Important aspects of the
                      long‐term degradation mechanisms are elucidated. It is
                      found that the capacity losses in these thin film batteries
                      are mainly related to lithium immobilization in the
                      solid‐state electrolyte, starting to grow at the
                      anode/electrolyte interface during initial charging. The
                      Li‐immobilization layer in the electrolyte is induced by
                      silicon penetration from the anode into the solid‐state
                      electrolyte and continues to grow at a lower rate during
                      subsequent cycling. X‐ray photoelectron spectroscopy depth
                      profiling and transmission electron microscopy analyses
                      confirm the formation of such immobilization layer, which
                      favorably functions as an ionic conductor for lithium ions.
                      As a result of the immobilization process, the amount of
                      free moveable lithium ions is reduced, leading to the
                      pronounced storage capacity decay. Insights gained from this
                      research shed interesting light on the degradation
                      mechanisms of thin film, all‐solid‐state LIB and
                      facilitate potential interfacial modifications which finally
                      will lead to substantially improved battery performance.},
      cin          = {IEK-9 / JCNS-FRM-II},
      ddc          = {600},
      cid          = {I:(DE-Juel1)IEK-9-20110218 /
                      I:(DE-Juel1)JCNS-FRM-II-20110218},
      pnm          = {131 - Electrochemical Storage (POF3-131)},
      pid          = {G:(DE-HGF)POF3-131},
      experiment   = {EXP:(DE-MLZ)External-20140101},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000448257300007},
      doi          = {10.1002/aenm.201801430},
      url          = {https://juser.fz-juelich.de/record/852522},
}