TY  - JOUR
AU  - Du, Hongchu
TI  - A nonlinear filtering algorithm for denoising HR(S)TEM micrographs
JO  - Ultramicroscopy
VL  - 151
SN  - 0304-3991
CY  - Amsterdam
PB  - Elsevier Science
M1  - FZJ-2018-05458
SP  - 62 - 67
PY  - 2015
AB  - Noise reduction of micrographs is often an essential task in high resolution (scanning) transmission electron microscopy (HR(S)TEM) either for a higher visual quality or for a more accurate quantification. Since HR(S)TEM studies are often aimed at resolving periodic atomistic columns and their non-periodic deviation at defects, it is important to develop a noise reduction algorithm that can simultaneously handle both periodic and non-periodic features properly. In this work, a nonlinear filtering algorithm is developed based on widely used techniques of low-pass filter and Wiener filter, which can efficiently reduce noise without noticeable artifacts even in HR(S)TEM micrographs with contrast of variation of background and defects. The developed nonlinear filtering algorithm is particularly suitable for quantitative electron microscopy, and is also of great interest for beam sensitive samples, in situ analyses, and atomic resolution EFTEM.
LB  - PUB:(DE-HGF)16
C6  - pmid:25465498
UR  - <Go to ISI:>//WOS:000351237800009
DO  - DOI:10.1016/j.ultramic.2014.11.012
UR  - https://juser.fz-juelich.de/record/852538
ER  -