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@ARTICLE{Du:852538,
author = {Du, Hongchu},
title = {{A} nonlinear filtering algorithm for denoising
{HR}({S}){TEM} micrographs},
journal = {Ultramicroscopy},
volume = {151},
issn = {0304-3991},
address = {Amsterdam},
publisher = {Elsevier Science},
reportid = {FZJ-2018-05458},
pages = {62 - 67},
year = {2015},
abstract = {Noise reduction of micrographs is often an essential task
in high resolution (scanning) transmission electron
microscopy (HR(S)TEM) either for a higher visual quality or
for a more accurate quantification. Since HR(S)TEM studies
are often aimed at resolving periodic atomistic columns and
their non-periodic deviation at defects, it is important to
develop a noise reduction algorithm that can simultaneously
handle both periodic and non-periodic features properly. In
this work, a nonlinear filtering algorithm is developed
based on widely used techniques of low-pass filter and
Wiener filter, which can efficiently reduce noise without
noticeable artifacts even in HR(S)TEM micrographs with
contrast of variation of background and defects. The
developed nonlinear filtering algorithm is particularly
suitable for quantitative electron microscopy, and is also
of great interest for beam sensitive samples, in situ
analyses, and atomic resolution EFTEM.},
cin = {PGI-5},
ddc = {570},
cid = {I:(DE-Juel1)PGI-5-20110106},
pnm = {143 - Controlling Configuration-Based Phenomena (POF3-143)},
pid = {G:(DE-HGF)POF3-143},
typ = {PUB:(DE-HGF)16},
pubmed = {pmid:25465498},
UT = {WOS:000351237800009},
doi = {10.1016/j.ultramic.2014.11.012},
url = {https://juser.fz-juelich.de/record/852538},
}