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@ARTICLE{Lentzen:856488,
author = {Lentzen, Markus},
title = {{T}he refractive index in electron microscopy and the
errors of its approximations},
journal = {Ultramicroscopy},
volume = {176},
issn = {0304-3991},
address = {Amsterdam},
publisher = {Elsevier Science},
reportid = {FZJ-2018-05882},
pages = {139},
year = {2017},
abstract = {In numerical calculations for electron diffraction often a
simplified form of the electron-optical refractive index,
linear in the electric potential, is used. In recent years
improved calculation schemes have been proposed, aiming at
higher accuracy by including higher-order terms of the
electric potential. These schemes start from the
relativistically corrected Schrödinger equation, and use a
second simplified form, now for the refractive index
squared, being linear in the electric potential. The second
and higher-order corrections thus determined have, however,
a large error, compared to those derived from the
relativistically correct refractive index. The impact of the
two simplifications on electron diffraction calculations is
assessed through numerical comparison of the refractive
index at high-angle Coulomb scattering and of cross-sections
for a wide range of scattering angles, kinetic energies, and
atomic numbers.},
cin = {ER-C-1},
ddc = {570},
cid = {I:(DE-Juel1)ER-C-1-20170209},
pnm = {143 - Controlling Configuration-Based Phenomena (POF3-143)},
pid = {G:(DE-HGF)POF3-143},
typ = {PUB:(DE-HGF)16},
pubmed = {pmid:28011113},
UT = {WOS:000403992200019},
doi = {10.1016/j.ultramic.2016.10.001},
url = {https://juser.fz-juelich.de/record/856488},
}