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@ARTICLE{Yu:856489,
      author       = {Yu, R. and Lentzen, Markus and Zhu, J.},
      title        = {{E}ffective object planes for aberration-corrected
                      transmission electron microscopy},
      journal      = {Ultramicroscopy},
      volume       = {112},
      number       = {1},
      issn         = {0304-3991},
      address      = {Amsterdam},
      publisher    = {Elsevier Science},
      reportid     = {FZJ-2018-05883},
      pages        = {15},
      year         = {2012},
      abstract     = {In aberration-corrected transmission electron microscopy,
                      the image contrast depends sensitively on the focus value.
                      With the point resolution extended to an information limit
                      of below 0.1 nm, even a focus change of as small as one
                      nanometer could give a significant change in image contrast.
                      Therefore, it is necessary to consider in detail the optimum
                      focus condition in order to take full advantage of
                      aberration-correction. In this study, the thickness
                      dependence of the minimum contrast focus has been
                      investigated by dynamical image simulations for amorphous
                      model structures of carbon, germanium, and tungsten, which
                      were constructed by molecular dynamics simulations. The
                      calculation results show that the minimum contrast focus
                      varies with the object thickness, supporting the use of an
                      effective object plane close to the midplane instead of the
                      exit plane of a sample, as suggested by Bonhomme and
                      Beorchia [J. Phys. D: Appl. Phys. 16, 705 (1983)] and
                      Lentzen [Microscopy and Microanalysis 12, 191 (2006)]. Thus
                      supported particles and wedge-shaped crystals with
                      symmetrical top and bottom surfaces could be imaged at a
                      focus condition independent of the uneven bottom face. Image
                      simulations of crystalline samples as a function of focus
                      and thickness show: for an object thickness of less than 10
                      nm, the optimum focus condition is matched better if the
                      midplane of the object, instead of the exit plane, is chosen
                      as reference plane.},
      cin          = {ER-C-1},
      ddc          = {570},
      cid          = {I:(DE-Juel1)ER-C-1-20170209},
      pnm          = {143 - Controlling Configuration-Based Phenomena (POF3-143)},
      pid          = {G:(DE-HGF)POF3-143},
      typ          = {PUB:(DE-HGF)16},
      pubmed       = {pmid:22081044},
      UT           = {WOS:000300461600003},
      doi          = {10.1016/j.ultramic.2011.10.006},
      url          = {https://juser.fz-juelich.de/record/856489},
}