%0 Journal Article
%A Voigtländer, Bert
%A Cherepanov, Vasily
%A Korte, Stefan
%A Leis, Arthur
%A Cuma, David
%A Just, Sven
%A Lüpke, Felix
%T Invited Review Article: Multi-tip scanning tunneling microscopy: Experimental techniques and data analysis
%J Review of scientific instruments
%V 89
%N 10
%@ 1089-7623
%C [S.l.]
%I American Institute of Physics
%M FZJ-2018-05889
%P 101101-1 - 101101-23
%D 2018
%X In scanning tunneling microscopy, we witness in recent years a paradigm shift from “just imaging” to detailed spectroscopic measurements at the nanoscale and multi-tip scanning tunneling microscope (STM) is a technique following this trend. It is capable of performing nanoscale charge transport measurements like a “multimeter at the nanoscale.” Distance-dependent four-point measurements, the acquisition of nanoscale potential maps at current carrying nanostructures and surfaces, as well as the acquisition of I − V curves of nanoelectronic devices are examples of the capabilities of the multi-tip STM technique. In this review, we focus on two aspects: How to perform the multi-tip STM measurements and how to analyze the acquired data in order to gain insight into nanoscale charge transport processes for a variety of samples. We further discuss specifics of the electronics for multi-tip STM and the properties of tips for multi-tip STM, and present methods for a tip approach to nanostructures on insulating substrates. We introduce methods on how to extract the conductivity/resistivity for mixed 2D/3D systems from four-point measurements, how to measure the conductivity of 2D sheets, and how to introduce scanning tunneling potentiometry measurements with a multi-tip setup. For the example of multi-tip measurements at freestanding vapor liquid solid grown nanowires, we discuss contact resistances as well as the influence of the presence of the probing tips on the four point measurements.
%F PUB:(DE-HGF)16
%9 Journal Article
%$ pmid:30399776
%U <Go to ISI:>//WOS:000449144500262
%R 10.1063/1.5042346
%U https://juser.fz-juelich.de/record/856502