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000856502 1001_ $$0P:(DE-Juel1)128794$$aVoigtländer, Bert$$b0$$eCorresponding author
000856502 245__ $$aInvited Review Article: Multi-tip scanning tunneling microscopy: Experimental techniques and data analysis
000856502 260__ $$a[S.l.]$$bAmerican Institute of Physics$$c2018
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000856502 520__ $$aIn scanning tunneling microscopy, we witness in recent years a paradigm shift from “just imaging” to detailed spectroscopic measurements at the nanoscale and multi-tip scanning tunneling microscope (STM) is a technique following this trend. It is capable of performing nanoscale charge transport measurements like a “multimeter at the nanoscale.” Distance-dependent four-point measurements, the acquisition of nanoscale potential maps at current carrying nanostructures and surfaces, as well as the acquisition of I − V curves of nanoelectronic devices are examples of the capabilities of the multi-tip STM technique. In this review, we focus on two aspects: How to perform the multi-tip STM measurements and how to analyze the acquired data in order to gain insight into nanoscale charge transport processes for a variety of samples. We further discuss specifics of the electronics for multi-tip STM and the properties of tips for multi-tip STM, and present methods for a tip approach to nanostructures on insulating substrates. We introduce methods on how to extract the conductivity/resistivity for mixed 2D/3D systems from four-point measurements, how to measure the conductivity of 2D sheets, and how to introduce scanning tunneling potentiometry measurements with a multi-tip setup. For the example of multi-tip measurements at freestanding vapor liquid solid grown nanowires, we discuss contact resistances as well as the influence of the presence of the probing tips on the four point measurements.
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000856502 7001_ $$0P:(DE-Juel1)128762$$aCherepanov, Vasily$$b1
000856502 7001_ $$0P:(DE-Juel1)138943$$aKorte, Stefan$$b2
000856502 7001_ $$0P:(DE-Juel1)168208$$aLeis, Arthur$$b3
000856502 7001_ $$0P:(DE-Juel1)171548$$aCuma, David$$b4
000856502 7001_ $$0P:(DE-Juel1)162164$$aJust, Sven$$b5
000856502 7001_ $$0P:(DE-Juel1)162163$$aLüpke, Felix$$b6
000856502 773__ $$0PERI:(DE-600)1472905-2$$a10.1063/1.5042346$$gVol. 89, no. 10, p. 101101 -$$n10$$p101101-1 - 101101-23$$tReview of scientific instruments$$v89$$x1089-7623$$y2018
000856502 8564_ $$uhttps://juser.fz-juelich.de/record/856502/files/1.5042346.pdf$$yPublished on 2018-10-15. Available in OpenAccess from 2019-10-15.
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