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@ARTICLE{Voigtlnder:856502,
      author       = {Voigtländer, Bert and Cherepanov, Vasily and Korte, Stefan
                      and Leis, Arthur and Cuma, David and Just, Sven and Lüpke,
                      Felix},
      title        = {{I}nvited {R}eview {A}rticle: {M}ulti-tip scanning
                      tunneling microscopy: {E}xperimental techniques and data
                      analysis},
      journal      = {Review of scientific instruments},
      volume       = {89},
      number       = {10},
      issn         = {1089-7623},
      address      = {[S.l.]},
      publisher    = {American Institute of Physics},
      reportid     = {FZJ-2018-05889},
      pages        = {101101-1 - 101101-23},
      year         = {2018},
      abstract     = {In scanning tunneling microscopy, we witness in recent
                      years a paradigm shift from “just imaging” to detailed
                      spectroscopic measurements at the nanoscale and multi-tip
                      scanning tunneling microscope (STM) is a technique following
                      this trend. It is capable of performing nanoscale charge
                      transport measurements like a “multimeter at the
                      nanoscale.” Distance-dependent four-point measurements,
                      the acquisition of nanoscale potential maps at current
                      carrying nanostructures and surfaces, as well as the
                      acquisition of I − V curves of nanoelectronic devices are
                      examples of the capabilities of the multi-tip STM technique.
                      In this review, we focus on two aspects: How to perform the
                      multi-tip STM measurements and how to analyze the acquired
                      data in order to gain insight into nanoscale charge
                      transport processes for a variety of samples. We further
                      discuss specifics of the electronics for multi-tip STM and
                      the properties of tips for multi-tip STM, and present
                      methods for a tip approach to nanostructures on insulating
                      substrates. We introduce methods on how to extract the
                      conductivity/resistivity for mixed 2D/3D systems from
                      four-point measurements, how to measure the conductivity of
                      2D sheets, and how to introduce scanning tunneling
                      potentiometry measurements with a multi-tip setup. For the
                      example of multi-tip measurements at freestanding vapor
                      liquid solid grown nanowires, we discuss contact resistances
                      as well as the influence of the presence of the probing tips
                      on the four point measurements.},
      cin          = {PGI-3},
      ddc          = {620},
      cid          = {I:(DE-Juel1)PGI-3-20110106},
      pnm          = {141 - Controlling Electron Charge-Based Phenomena
                      (POF3-141)},
      pid          = {G:(DE-HGF)POF3-141},
      typ          = {PUB:(DE-HGF)16},
      pubmed       = {pmid:30399776},
      UT           = {WOS:000449144500262},
      doi          = {10.1063/1.5042346},
      url          = {https://juser.fz-juelich.de/record/856502},
}