001     856502
005     20210129235305.0
024 7 _ |a 10.1063/1.5042346
|2 doi
024 7 _ |a 0034-6748
|2 ISSN
024 7 _ |a 1089-7623
|2 ISSN
024 7 _ |a 1527-2400
|2 ISSN
024 7 _ |a 2128/19814
|2 Handle
024 7 _ |a pmid:30399776
|2 pmid
024 7 _ |a WOS:000449144500262
|2 WOS
024 7 _ |a altmetric:49999811
|2 altmetric
037 _ _ |a FZJ-2018-05889
041 _ _ |a English
082 _ _ |a 620
100 1 _ |a Voigtländer, Bert
|0 P:(DE-Juel1)128794
|b 0
|e Corresponding author
245 _ _ |a Invited Review Article: Multi-tip scanning tunneling microscopy: Experimental techniques and data analysis
260 _ _ |a [S.l.]
|c 2018
|b American Institute of Physics
336 7 _ |a article
|2 DRIVER
336 7 _ |a Output Types/Journal article
|2 DataCite
336 7 _ |a Journal Article
|b journal
|m journal
|0 PUB:(DE-HGF)16
|s 1547134427_3110
|2 PUB:(DE-HGF)
336 7 _ |a ARTICLE
|2 BibTeX
336 7 _ |a JOURNAL_ARTICLE
|2 ORCID
336 7 _ |a Journal Article
|0 0
|2 EndNote
520 _ _ |a In scanning tunneling microscopy, we witness in recent years a paradigm shift from “just imaging” to detailed spectroscopic measurements at the nanoscale and multi-tip scanning tunneling microscope (STM) is a technique following this trend. It is capable of performing nanoscale charge transport measurements like a “multimeter at the nanoscale.” Distance-dependent four-point measurements, the acquisition of nanoscale potential maps at current carrying nanostructures and surfaces, as well as the acquisition of I − V curves of nanoelectronic devices are examples of the capabilities of the multi-tip STM technique. In this review, we focus on two aspects: How to perform the multi-tip STM measurements and how to analyze the acquired data in order to gain insight into nanoscale charge transport processes for a variety of samples. We further discuss specifics of the electronics for multi-tip STM and the properties of tips for multi-tip STM, and present methods for a tip approach to nanostructures on insulating substrates. We introduce methods on how to extract the conductivity/resistivity for mixed 2D/3D systems from four-point measurements, how to measure the conductivity of 2D sheets, and how to introduce scanning tunneling potentiometry measurements with a multi-tip setup. For the example of multi-tip measurements at freestanding vapor liquid solid grown nanowires, we discuss contact resistances as well as the influence of the presence of the probing tips on the four point measurements.
536 _ _ |a 141 - Controlling Electron Charge-Based Phenomena (POF3-141)
|0 G:(DE-HGF)POF3-141
|c POF3-141
|f POF III
|x 0
588 _ _ |a Dataset connected to CrossRef
700 1 _ |a Cherepanov, Vasily
|0 P:(DE-Juel1)128762
|b 1
700 1 _ |a Korte, Stefan
|0 P:(DE-Juel1)138943
|b 2
700 1 _ |a Leis, Arthur
|0 P:(DE-Juel1)168208
|b 3
700 1 _ |a Cuma, David
|0 P:(DE-Juel1)171548
|b 4
700 1 _ |a Just, Sven
|0 P:(DE-Juel1)162164
|b 5
700 1 _ |a Lüpke, Felix
|0 P:(DE-Juel1)162163
|b 6
773 _ _ |a 10.1063/1.5042346
|g Vol. 89, no. 10, p. 101101 -
|0 PERI:(DE-600)1472905-2
|n 10
|p 101101-1 - 101101-23
|t Review of scientific instruments
|v 89
|y 2018
|x 1089-7623
856 4 _ |u https://juser.fz-juelich.de/record/856502/files/1.5042346.pdf
|y Published on 2018-10-15. Available in OpenAccess from 2019-10-15.
856 4 _ |u https://juser.fz-juelich.de/record/856502/files/1.5042346.pdf?subformat=pdfa
|x pdfa
|y Published on 2018-10-15. Available in OpenAccess from 2019-10-15.
909 C O |o oai:juser.fz-juelich.de:856502
|p openaire
|p open_access
|p VDB
|p driver
|p dnbdelivery
910 1 _ |a Forschungszentrum Jülich
|0 I:(DE-588b)5008462-8
|k FZJ
|b 0
|6 P:(DE-Juel1)128794
910 1 _ |a Forschungszentrum Jülich
|0 I:(DE-588b)5008462-8
|k FZJ
|b 1
|6 P:(DE-Juel1)128762
910 1 _ |a Forschungszentrum Jülich
|0 I:(DE-588b)5008462-8
|k FZJ
|b 2
|6 P:(DE-Juel1)138943
910 1 _ |a Forschungszentrum Jülich
|0 I:(DE-588b)5008462-8
|k FZJ
|b 3
|6 P:(DE-Juel1)168208
910 1 _ |a Forschungszentrum Jülich
|0 I:(DE-588b)5008462-8
|k FZJ
|b 4
|6 P:(DE-Juel1)171548
910 1 _ |a Forschungszentrum Jülich
|0 I:(DE-588b)5008462-8
|k FZJ
|b 5
|6 P:(DE-Juel1)162164
910 1 _ |a Forschungszentrum Jülich
|0 I:(DE-588b)5008462-8
|k FZJ
|b 6
|6 P:(DE-Juel1)162163
913 1 _ |a DE-HGF
|l Future Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)
|1 G:(DE-HGF)POF3-140
|0 G:(DE-HGF)POF3-141
|2 G:(DE-HGF)POF3-100
|v Controlling Electron Charge-Based Phenomena
|x 0
|4 G:(DE-HGF)POF
|3 G:(DE-HGF)POF3
|b Energie
914 1 _ |y 2018
915 _ _ |a DBCoverage
|0 StatID:(DE-HGF)0200
|2 StatID
|b SCOPUS
915 _ _ |a DBCoverage
|0 StatID:(DE-HGF)1160
|2 StatID
|b Current Contents - Engineering, Computing and Technology
915 _ _ |a DBCoverage
|0 StatID:(DE-HGF)0600
|2 StatID
|b Ebsco Academic Search
915 _ _ |a Embargoed OpenAccess
|0 StatID:(DE-HGF)0530
|2 StatID
915 _ _ |a JCR
|0 StatID:(DE-HGF)0100
|2 StatID
|b REV SCI INSTRUM : 2017
915 _ _ |a DBCoverage
|0 StatID:(DE-HGF)0150
|2 StatID
|b Web of Science Core Collection
915 _ _ |a WoS
|0 StatID:(DE-HGF)0110
|2 StatID
|b Science Citation Index
915 _ _ |a WoS
|0 StatID:(DE-HGF)0111
|2 StatID
|b Science Citation Index Expanded
915 _ _ |a IF < 5
|0 StatID:(DE-HGF)9900
|2 StatID
915 _ _ |a Peer Review
|0 StatID:(DE-HGF)0030
|2 StatID
|b ASC
915 _ _ |a DBCoverage
|0 StatID:(DE-HGF)1150
|2 StatID
|b Current Contents - Physical, Chemical and Earth Sciences
915 _ _ |a National-Konsortium
|0 StatID:(DE-HGF)0430
|2 StatID
915 _ _ |a DBCoverage
|0 StatID:(DE-HGF)0300
|2 StatID
|b Medline
915 _ _ |a DBCoverage
|0 StatID:(DE-HGF)0320
|2 StatID
|b PubMed Central
915 _ _ |a Nationallizenz
|0 StatID:(DE-HGF)0420
|2 StatID
915 _ _ |a DBCoverage
|0 StatID:(DE-HGF)0199
|2 StatID
|b Clarivate Analytics Master Journal List
920 _ _ |l yes
920 1 _ |0 I:(DE-Juel1)PGI-3-20110106
|k PGI-3
|l Funktionale Nanostrukturen an Oberflächen
|x 0
980 _ _ |a journal
980 _ _ |a VDB
980 _ _ |a I:(DE-Juel1)PGI-3-20110106
980 _ _ |a UNRESTRICTED
980 1 _ |a FullTexts


LibraryCollectionCLSMajorCLSMinorLanguageAuthor
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