Home > Publications database > Invited Review Article: Multi-tip scanning tunneling microscopy: Experimental techniques and data analysis > print |
001 | 856502 | ||
005 | 20210129235305.0 | ||
024 | 7 | _ | |a 10.1063/1.5042346 |2 doi |
024 | 7 | _ | |a 0034-6748 |2 ISSN |
024 | 7 | _ | |a 1089-7623 |2 ISSN |
024 | 7 | _ | |a 1527-2400 |2 ISSN |
024 | 7 | _ | |a 2128/19814 |2 Handle |
024 | 7 | _ | |a pmid:30399776 |2 pmid |
024 | 7 | _ | |a WOS:000449144500262 |2 WOS |
024 | 7 | _ | |a altmetric:49999811 |2 altmetric |
037 | _ | _ | |a FZJ-2018-05889 |
041 | _ | _ | |a English |
082 | _ | _ | |a 620 |
100 | 1 | _ | |a Voigtländer, Bert |0 P:(DE-Juel1)128794 |b 0 |e Corresponding author |
245 | _ | _ | |a Invited Review Article: Multi-tip scanning tunneling microscopy: Experimental techniques and data analysis |
260 | _ | _ | |a [S.l.] |c 2018 |b American Institute of Physics |
336 | 7 | _ | |a article |2 DRIVER |
336 | 7 | _ | |a Output Types/Journal article |2 DataCite |
336 | 7 | _ | |a Journal Article |b journal |m journal |0 PUB:(DE-HGF)16 |s 1547134427_3110 |2 PUB:(DE-HGF) |
336 | 7 | _ | |a ARTICLE |2 BibTeX |
336 | 7 | _ | |a JOURNAL_ARTICLE |2 ORCID |
336 | 7 | _ | |a Journal Article |0 0 |2 EndNote |
520 | _ | _ | |a In scanning tunneling microscopy, we witness in recent years a paradigm shift from “just imaging” to detailed spectroscopic measurements at the nanoscale and multi-tip scanning tunneling microscope (STM) is a technique following this trend. It is capable of performing nanoscale charge transport measurements like a “multimeter at the nanoscale.” Distance-dependent four-point measurements, the acquisition of nanoscale potential maps at current carrying nanostructures and surfaces, as well as the acquisition of I − V curves of nanoelectronic devices are examples of the capabilities of the multi-tip STM technique. In this review, we focus on two aspects: How to perform the multi-tip STM measurements and how to analyze the acquired data in order to gain insight into nanoscale charge transport processes for a variety of samples. We further discuss specifics of the electronics for multi-tip STM and the properties of tips for multi-tip STM, and present methods for a tip approach to nanostructures on insulating substrates. We introduce methods on how to extract the conductivity/resistivity for mixed 2D/3D systems from four-point measurements, how to measure the conductivity of 2D sheets, and how to introduce scanning tunneling potentiometry measurements with a multi-tip setup. For the example of multi-tip measurements at freestanding vapor liquid solid grown nanowires, we discuss contact resistances as well as the influence of the presence of the probing tips on the four point measurements. |
536 | _ | _ | |a 141 - Controlling Electron Charge-Based Phenomena (POF3-141) |0 G:(DE-HGF)POF3-141 |c POF3-141 |f POF III |x 0 |
588 | _ | _ | |a Dataset connected to CrossRef |
700 | 1 | _ | |a Cherepanov, Vasily |0 P:(DE-Juel1)128762 |b 1 |
700 | 1 | _ | |a Korte, Stefan |0 P:(DE-Juel1)138943 |b 2 |
700 | 1 | _ | |a Leis, Arthur |0 P:(DE-Juel1)168208 |b 3 |
700 | 1 | _ | |a Cuma, David |0 P:(DE-Juel1)171548 |b 4 |
700 | 1 | _ | |a Just, Sven |0 P:(DE-Juel1)162164 |b 5 |
700 | 1 | _ | |a Lüpke, Felix |0 P:(DE-Juel1)162163 |b 6 |
773 | _ | _ | |a 10.1063/1.5042346 |g Vol. 89, no. 10, p. 101101 - |0 PERI:(DE-600)1472905-2 |n 10 |p 101101-1 - 101101-23 |t Review of scientific instruments |v 89 |y 2018 |x 1089-7623 |
856 | 4 | _ | |u https://juser.fz-juelich.de/record/856502/files/1.5042346.pdf |y Published on 2018-10-15. Available in OpenAccess from 2019-10-15. |
856 | 4 | _ | |u https://juser.fz-juelich.de/record/856502/files/1.5042346.pdf?subformat=pdfa |x pdfa |y Published on 2018-10-15. Available in OpenAccess from 2019-10-15. |
909 | C | O | |o oai:juser.fz-juelich.de:856502 |p openaire |p open_access |p VDB |p driver |p dnbdelivery |
910 | 1 | _ | |a Forschungszentrum Jülich |0 I:(DE-588b)5008462-8 |k FZJ |b 0 |6 P:(DE-Juel1)128794 |
910 | 1 | _ | |a Forschungszentrum Jülich |0 I:(DE-588b)5008462-8 |k FZJ |b 1 |6 P:(DE-Juel1)128762 |
910 | 1 | _ | |a Forschungszentrum Jülich |0 I:(DE-588b)5008462-8 |k FZJ |b 2 |6 P:(DE-Juel1)138943 |
910 | 1 | _ | |a Forschungszentrum Jülich |0 I:(DE-588b)5008462-8 |k FZJ |b 3 |6 P:(DE-Juel1)168208 |
910 | 1 | _ | |a Forschungszentrum Jülich |0 I:(DE-588b)5008462-8 |k FZJ |b 4 |6 P:(DE-Juel1)171548 |
910 | 1 | _ | |a Forschungszentrum Jülich |0 I:(DE-588b)5008462-8 |k FZJ |b 5 |6 P:(DE-Juel1)162164 |
910 | 1 | _ | |a Forschungszentrum Jülich |0 I:(DE-588b)5008462-8 |k FZJ |b 6 |6 P:(DE-Juel1)162163 |
913 | 1 | _ | |a DE-HGF |l Future Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT) |1 G:(DE-HGF)POF3-140 |0 G:(DE-HGF)POF3-141 |2 G:(DE-HGF)POF3-100 |v Controlling Electron Charge-Based Phenomena |x 0 |4 G:(DE-HGF)POF |3 G:(DE-HGF)POF3 |b Energie |
914 | 1 | _ | |y 2018 |
915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)0200 |2 StatID |b SCOPUS |
915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)1160 |2 StatID |b Current Contents - Engineering, Computing and Technology |
915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)0600 |2 StatID |b Ebsco Academic Search |
915 | _ | _ | |a Embargoed OpenAccess |0 StatID:(DE-HGF)0530 |2 StatID |
915 | _ | _ | |a JCR |0 StatID:(DE-HGF)0100 |2 StatID |b REV SCI INSTRUM : 2017 |
915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)0150 |2 StatID |b Web of Science Core Collection |
915 | _ | _ | |a WoS |0 StatID:(DE-HGF)0110 |2 StatID |b Science Citation Index |
915 | _ | _ | |a WoS |0 StatID:(DE-HGF)0111 |2 StatID |b Science Citation Index Expanded |
915 | _ | _ | |a IF < 5 |0 StatID:(DE-HGF)9900 |2 StatID |
915 | _ | _ | |a Peer Review |0 StatID:(DE-HGF)0030 |2 StatID |b ASC |
915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)1150 |2 StatID |b Current Contents - Physical, Chemical and Earth Sciences |
915 | _ | _ | |a National-Konsortium |0 StatID:(DE-HGF)0430 |2 StatID |
915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)0300 |2 StatID |b Medline |
915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)0320 |2 StatID |b PubMed Central |
915 | _ | _ | |a Nationallizenz |0 StatID:(DE-HGF)0420 |2 StatID |
915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)0199 |2 StatID |b Clarivate Analytics Master Journal List |
920 | _ | _ | |l yes |
920 | 1 | _ | |0 I:(DE-Juel1)PGI-3-20110106 |k PGI-3 |l Funktionale Nanostrukturen an Oberflächen |x 0 |
980 | _ | _ | |a journal |
980 | _ | _ | |a VDB |
980 | _ | _ | |a I:(DE-Juel1)PGI-3-20110106 |
980 | _ | _ | |a UNRESTRICTED |
980 | 1 | _ | |a FullTexts |
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