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@PHDTHESIS{Lpke:856930,
author = {Lüpke, Felix},
title = {{S}canning tunneling potentiometry at nanoscale defects in
thin films},
volume = {185},
school = {RWTH Aachen},
type = {Dr.},
address = {Jülich},
publisher = {Forschungszentrum Jülich GmbH Zentralbibliothek, Verlag},
reportid = {FZJ-2018-06257},
isbn = {978-3-95806-361-7},
series = {Schriften des Forschungszentrums Jülich. Reihe
Schlüsseltechnologien / Key Technologies},
pages = {IV, 144 S.},
year = {2018},
note = {RWTH Aachen, Diss., 2017},
abstract = {The continuous miniaturization of electronics has led to
smaller and more powerful devices inour everyday life, such
as smart phones and tablet computers. This process is
substantiated by Moore’s law, which predicts shrinking of
electronic devices by a factor of two every two years[1].
While this model described the development over the last
decades astonishingly well, it has come clear that it will
break down in the near future [2, 3, 4, 5], which results
from technical challenges in the fabrication of such small
devices. However, even if the fabrication technology would
not be the limiting factor, it is clear that at some point a
fundamental size-limit for a classical transistor is reached
– a single-atom transistor [6]. Generally, transistors
consist of areas of differently doped semiconductors, mainly
silicon (Si). The doping is the result of atomic defects
within this host lattice of Si atoms. The positioning of the
dopants in the Si lattice is a random process, such that for
ultra-small devices, in the limit where the doping of the Si
is determined by only a few doping atoms, small variations
in the local dopant configuration can have large effects on
the resulting device properties. The same is true for
unintentional lattice defects, such as lattice vacancies,
interstitial atoms, domain boundaries and step edges on the
sample surface. In large devices, the exact number of such
defects often is not too critical because the device
properties are average over a large volume. In a device
consisting of only few atoms however, e.g. an unintended
atomic vacancy almost certainly leads to a failure of the
device. As a result, the search for alternative concepts for
future electronics is flourishing. Recent developments show
that spintronics (spin-based electronics) [7] and quantum
computing [8] could be a next big step in computer
technology. At the forefront of these two topics are
three-dimensional topological insulators (3D TIs), which
have been first proposed in 2005 [9] by C. L. Kane and E. J.
Mele. What makes these materials promising candidates for
future electronic devices are their two-dimensional surface
states, where the spin of the charge carriers is locked to
their momentum. Furthermore, the corresponding dispersion
relation has the form of a linear dependence of the energy
on the impulse, resulting in the so-called Dirac cone [10].
As a result, new pathways for the realization of spintronics
are opened, where the spin polarization of a current can be
controlled simply its current direction. Furthermore, it has
been shown that TIs in combination with superconductors can
lead to the formation of Majorana fermions [11], which are
theoretically predicted to be suitable for the preparation
of quantum bits [12, 13]. The combination of multiple of
such quantum bits into quantum computers has the potential
to solve certain problems much faster than any classical
computers [14]. However, for these new materials to find
their ways into applications, a miniaturization of the
corresponding devices is required. Here, again the
fabrication of ultra-small devices depends crucially on the
behavior of defects in such systems. Due to this ultimate
importance, the fundamental properties of defects under
current flow have acquired an increasing interest in the
research community and also electronics industry [15, 16,17,
18, 19]. ...},
cin = {PGI-3},
cid = {I:(DE-Juel1)PGI-3-20110106},
pnm = {899 - ohne Topic (POF3-899)},
pid = {G:(DE-HGF)POF3-899},
typ = {PUB:(DE-HGF)3 / PUB:(DE-HGF)11},
url = {https://juser.fz-juelich.de/record/856930},
}