%0 Conference Paper
%A Vezhlev, Egor
%A Ioffe, Alexander
%A Mattauch, Stefan
%A Friese, Karen
%A Brückel, Thomas
%A Chen, Chunguang
%A Danilov, Dmitri
%A Notten, Peter H. L.
%A Eichel, Rüdiger-A.
%T Neutron Depth profiling at a focused neutron beam: a method of
%M FZJ-2018-06674
%D 2018
%B AMPEA-EERA workshop on Synchrotron Radiation and Neutron Scattering for Energy Materials
%C 12 Nov 2018 - 14 Nov 2018, Berlin (Germany)
Y2 12 Nov 2018 - 14 Nov 2018
M2 Berlin, Germany
%F PUB:(DE-HGF)6
%9 Conference Presentation
%U https://juser.fz-juelich.de/record/857702